Join us for the open track sessions on Modeling, Identification, Estimation and Control in Micromechatronic Systems, at IFAC World Congress 2020, in Berlin, Germany. Organizers: Prof Helon Vicente Hultmann Ayala, Pontifical Catholic University of Rio [...]
Special Session on Micro and Nano Precision Mechatronics at the 2019 MARSS Conference, Helsinki, Finland, 1-5 July 2019
Join us at a special session at the 2019 International Conference on Manipulation, Automation and Robotics at Small Scales (MARSS) conference, with the goal of bringing together researchers and engineers to advance the state-of-the-art in [...]
Listen to PhD candidate Natan Franco discuss his research on atomic force microscopes during with Robyn Williams from ABC Radio National
Dr Michael Ruppert was recently interviewed by the IEEE Control Systems Magazine. The interview was published in Volume 39, Issue 3 in June 2019 under the People in Control column. Click here to read the [...]
Congratulations to Matheus Xavier who received the second place award for Best Oral and Poster Presentation at the IEEE International Conference on Control, Mechatronics and Automation held at TU Delft, Netherlands from November 6-8. 2019/ [...]
Date & Venue Tuesday, 04 February 2020, 04:00pm EF122 Abstract The Atomic Force Microscope (AFM) has emerged as an indispensable research tool in the development of nanoscience and nanotechnology. Piezoelectrically actuated nanopositioning stages are widely [...]
Date & Venue Monday, 10 February 2020, 10:00am EF122 AbstractThe atomic force microscope (AFM) is a versatile tool that can operate in contact or dynamic mode on metallic, semiconductor, insulator or biological samples in liquid, [...]
Date & Venue Wednesday, 11 December 2019, 02:00pm EF122 Abstract In order to recover from fractures suffered in the limbs, intramedullary (IM) rods are inserted into the bone marrow canal. When in place, the IM [...]
Innovations in piezoelectric shunt damping Inproceedings
Proc. SPIE Symposium on Smart Materials and MEMs, Melbourne, Australia, 2000.
IEE Electronics Letters, 36 (18), pp. 1525–1526, 2000.