Ben Routley – Optics for Engineers

Date & Venue
Thursday, 20 September 2018, 02:00PM
EF122

Abstract
In this talk, the basic principles of optical design will be explained. Measurement techniques typically used by engineers will be covered. The talk focuses on the practical aspects and will skip most of the maths. A brief overview of the usage of CAD software packages for optical design […]

By |September 10th, 2018|Seminars|0 Comments

Invited Sessions on Precision Mechatronics at ACC 2019, Philadelphia,  Milwaukee, July 10-12, 2019

Join us in Philadelphia at ACC 2019 to collaborate with other researchers and engineers on the design and control of precision mechatronic systems including nanopositioning, microscopy, motion control, and lithography. The contributed papers will include advances from both academic and industrial researchers. In previous years, industrial involvement included companies such as: ASML, Agilent, IBM, […]

By |September 3rd, 2018|Conferences, Events|0 Comments

Omid Tayefeh – Exposure Planning for Scanning Laser Lithography

Date & Venue
Friday, 31 August 2018, 10:30AM
EF122

Abstract
Lithography is the process of selectively exposing optically sensitive materials during semiconductor fabrication. One issue with standard projection lithography is the high cost of infrastructure and mask sets. These costs may be prohibitively expensive for prototyping and low-volume production. Scanning-beam lithography methods are attractive alternatives to projection lithography […]

Johan Dahlin – A software approach to Machine learning

Date & Venue
Thursday, 16 August 2018, 02:00PM
EF122

Abstract
Machine learning is currently a hot research area which also is getting a lot of attention in the media. Many are talking about artificial intelligence and how automation will change the world and put people out of work. As a community, machine learning is built around open-software and […]

Hamed Sadeghian – Nano-Mechatronics Instrumentations to Probe Interactions at the Nano-scale

Date & Venue
Tuesday, 17 July 2018, 02:00PM
EF122

Abstract
Understanding the interactions of matter at nano-scale has become the key for the success of several applications. In nanoelectronics or semiconductor industry, it helps for better manufacturing (higher resolution towards sub-10 nm structures, more complex structures) and reliable nanometrology and nano-inspection (for improving the yield of process). One […]

Meysam Omidbeike – Independent Estimation of Temperature and Strain in Tee-Rosette Piezoresistive Strain Sensors

Date & Venue
Friday, 06 July 2018, 01:00PM
EF122

Abstract
This article proposes a novel technique for independent measurement of strain and temperature in piezoresistive strain sensors congured in a tee-rosette. The most notable property of piezoresistive sensors is their easy integration into MEMS fabrication processes and nanopositioning systems, which makes them highly advantageous for both size and […]

Michael Ruppert – Design of Hybrid Piezoelectric/Piezoresistive Cantilevers for Dynamic-mode Atomic Force Microscopy

Date & Venue
Tuesday, 03 July 2018, 02:00PM
EF122

Abstract
Atomic force microscope cantilevers with integrated actuation and sensing on the chip level provide several distinct advantages over conventional cantilever instrumentation. These include clean frequency responses, the possibility of down-scaling and parallelization to cantilever arrays as well as the absence of optical interferences. However, the two major difficulties […]

Steven Moore – Arbitrary placement of AFM cantilever higher eigenmodes using structural optimization

Date & Venue
Tuesday, 26 June 2018, 02:00PM
EF122

Abstract
This talk presents a novel cantilever design approach to place higher mode frequencies within a specific frequency band to alleviate instrumentation and Q control feasibility. This work is motivated by the emerging field of multifrequency atomic force microscopy which involves the excitation and/or detection of several cantilever modes […]

Petter Ersbo – Displacement Estimation for Interferometry by Particle Filtering

Date & Venue
Tuesday, 12 June 2018, 01:00PM
EAG01

Abstract
The current, least square (LS) based, method for displacement estimation was introduced 40 years ago. Today, computational power is much more readily available, which has opened up for the possibly employ novel and more advanced methods such as particle filtering. These methods may offer estimates with better statistical […]

Precision Mechatronics at the Advanced Intelligent Mechatronics (AIM) Conference, Auckland, New Zealand, July 9-12, 2018

Join us in Auckland, New Zealand at the conference on Advanced Intelligent Mechatronics (AIM) to collaborate with other researchers and engineers. Dr Ruppert and Dr Yong from the Precision Mechatronics lab and Prof Sadeghian from TNO, The Netherlands are organising an invited session on ‘Design and Control of Micro and Nano Precision Mechatronic Systems’.

This session covers state-of-the-art approaches to […]