Linlin Li: Tracking control of the scanner for high-speed scanning of the AFM

Date & Venue

Tuesday, 04 February 2020, 04:00pm



The Atomic Force Microscope (AFM) has emerged as an indispensable
research tool in the development of nanoscience and nanotechnology.
Piezoelectrically actuated nanopositioning stages are widely employed in
AFMs to realize accurate the positioning of the sample-to-be-scanned,
due to several performance advantages such as fine resolution,
repeatability, controllability, fast response, […]

By |February 16th, 2020|Seminars|0 Comments

Daniel Martin Jimenez: Atomic Force Microscopy: From Liquid to Ultra-high Vacuum Environments

Date & Venue Monday, 10 February 2020, 10:00am EF122 

AbstractThe atomic force microscope (AFM) is a versatile tool that can operate in contact or dynamic mode on metallic, semiconductor, insulator or biological samples in liquid, air and vacuum environments. The sensor and the operational mode of an AFM must be selected a priori before […]

By |January 30th, 2020|Seminars|0 Comments

Harm Schepens: Ultrasonic Orthopaedic Implant Release

Date & Venue
Wednesday, 11 December 2019, 02:00pm


In order to recover from fractures suffered in the limbs, intramedullary (IM) rods are inserted into the bone marrow canal. When in place, the IM rods ensure proper alignment of the fracture which allows the bone to heal naturally. However the removal of IM […]

By |January 21st, 2020|Seminars|0 Comments

Thomas Schön: Sequential Monte Carlo and Deep Regression

Date & Venue

Wednesday, 20 November 2019, 11:00am



This talk has two (for now) loosely connected parts: In the first part
we aim to provide intuition for the key mechanisms underlying the
sequential Monte Carlo (SMC) method (including the popular particle
filters and smoothers). SMC provide approximate solutions
to integration problems where there is a sequential structure […]

By |November 12th, 2019|Seminars|0 Comments

Michael Ruppert: Design and Control of Microelectromechanical Systems (MEMs)

Date & Venue:Monday, 25 November 2019, 03:00pmEF122

Abstract:The microcantilever is a precision microelectromechanical systems (MEMs) device and an integral component of a myriad of systems which have collectively enabled the steady progress in nanotechnology over the past three decades. It is a key component and sits at the heart of a variety of instruments for […]

By |November 12th, 2019|Seminars|0 Comments

Matheus S. Xavier – Experimental Characterisation of Hydraulic Fiber-Reinforced Soft Actuators for Worm-Like Robots

Date & Venue:Tuesday, 29 October 2019EF122


This article describes the design and fabrication of fiber-reinforced soft actuators for a worm-like robot designed to operate inside constrained tubes. The actuators include bending, extension and torsion. These actuators are experimentally characterised by measuring the deflection versus applied pressure. The results demonstrate […]

By |October 27th, 2019|Seminars|0 Comments

Natã Franco Soares De Bem – A Novel Microcantilever with Integrated Force and Displacement Sensors

Date & Venue:
Friday, 18 October 2019
An atomic force microscope consists of three basic components: a microcantilever with a sharp probe at one end, an XYZ nanopositioner, and an optical beam deflection system to measure the tip deflection of the microcantilever due to interaction forces between the tip and sample. It is a versatile tool […]

Micromechatronic Systems at IFAC World Congress, 2020

Join us for the open track sessions on Modeling, Identification, Estimation and Control in Micromechatronic Systems, at IFAC World Congress 2020, in Berlin, Germany.


Prof Helon Vicente Hultmann Ayala, Pontifical Catholic University of Rio de Janeiro, BrazilProf Tom Oomen, Eindhoven University of Technology, The Netherlands Prof Andrew Fleming, University of Newcastle, Australia, Prof […]

By |September 25th, 2019|Conferences, Events|0 Comments

Marc Chaigneau: NanoRaman – Correlated Tip-Enhanced Optical Spectroscopy and SPM

Date & VenueTuesday, 17 July 2019, 1:00pmEF122

Figure: AFM topographic, TERS and surface potential images of WSe2 flakes.

AbstractRaman spectroscopy and confocal Raman microscopy have already proved to be essential characterization tools in many areas of advanced research, with a number of these applications extending into industry. As time moves on, new applications that are […]

Luke McCourt: Two Photon Near Field Lithography

Date & Venue
Tuesday, 26 March 2019, 3:00pm

The next generation of integrated circuits will be mass produced using extreme ultra violet lithography (EUV). The short wavelength light sources and optical masks required are prohibitively expensive with commercial systems costing upwards of $1M. Furthermore, the optical masks are unique to each IC design. Two photon near […]