Date & VenueMonday, 21 January 2019, 01:00pmEF122 Abstract In non-linear systems where some form of averaging is present (inertia) or can be introduced (low-pass filter), it can sometimes be beneficial to purposefully introduce an additional noise or disturbance signal. This signal is known as dither, and the combination of a dither signal and averaging [...]
Date & Venue Tuesday, 04 December 2018, 11:00am EF122 Abstract Gaussian Mixtures (GMs) can be used as a universal density approximator. As such, they can capture multimodal, skewed, and heavy-tailed characteristics of densities describing dynamic behaviour, which appear throughout finance, robotics, and fault detection. In this seminar, we consider smoothing for a class of state-space [...]
Date & Venue Thursday, 01 November 2018, 02:00PM EF122 Abstract System identification for large scale continuous time nonlinear state space models, as common in mechatronics applications, remains a challenging task. Existing system identification methods can be deficient for complex nonlinear problems and computationally do not scale well on large problems, the focus of this work [...]
Date & Venue Wednesday, 17 October 2018, 02:00PM EF122 Abstract Conventional high-speed amplitude demodulation techniques are compared and shown to be incompatible with multifrequency atomic force microscopy (MF-AFM), due to a lack of sensitivity to multiple frequency components. Novel model-based methods including a Kalman and Lyapunov filter are proposed, which alleviate this issue while maintaining very high bandwidths. Additionally, mass-sensing [...]
Date & Venue Thursday, 04 October 2018, 02:00PM EF122 Abstract Extended targets are targets which potentially generate more than one measurement per time step. They are encountered in numerous applications, spanning from vehicle tracking with automotive radar, pedestrian tracking using laser range sensors, and surface vessel tracking with marine X-band radar. The generation of multiple [...]
Date & Venue Thursday, 20 September 2018, 02:00PM EF122 Abstract In this talk, the basic principles of optical design will be explained. Measurement techniques typically used by engineers will be covered. The talk focuses on the practical aspects and will skip most of the maths. A brief overview of the usage of CAD software packages [...]
Date & Venue Friday, 31 August 2018, 10:30AM EF122 Abstract Lithography is the process of selectively exposing optically sensitive materials during semiconductor fabrication. One issue with standard projection lithography is the high cost of infrastructure and mask sets. These costs may be prohibitively expensive for prototyping and low-volume production. Scanning-beam lithography methods are attractive alternatives [...]
Date & Venue Thursday, 16 August 2018, 02:00PM EF122 Abstract Machine learning is currently a hot research area which also is getting a lot of attention in the media. Many are talking about artificial intelligence and how automation will change the world and put people out of work. As a community, machine learning is built [...]
Date & Venue Tuesday, 17 July 2018, 02:00PM EF122 Abstract Understanding the interactions of matter at nano-scale has become the key for the success of several applications. In nanoelectronics or semiconductor industry, it helps for better manufacturing (higher resolution towards sub-10 nm structures, more complex structures) and reliable nanometrology and nano-inspection (for improving the yield [...]
Date & Venue Friday, 06 July 2018, 01:00PM EF122 Abstract This article proposes a novel technique for independent measurement of strain and temperature in piezoresistive strain sensors congured in a tee-rosette. The most notable property of piezoresistive sensors is their easy integration into MEMS fabrication processes and nanopositioning systems, which makes them highly advantageous for [...]