Date & Venue
Tuesday, 17 July 2019, 1:00pm
EF122

Figure: AFM topographic, TERS and surface potential images of WSe2 flakes.

Abstract
Raman spectroscopy and confocal Raman microscopy have already proved to be essential characterization tools in many areas of advanced research, with a number of these applications extending into industry. As time moves on, new applications that are not addressed by existing technologies arise. Indeed, at the nanoscale, materials exhibit different properties than at the macro level, often quite dramatically different. The characterization of nanomaterials naturally requires imaging techniques with resolution at the same scale or better, so that local property variations can be discerned and defects properly detected; only with this understanding can the material properties be engineered to meet the performance requirements of next-generation devices.

In this seminar, we will present new nano-imaging capabilities to perform such measurements. Tip-enhanced optical spectroscopies (TEOS) such as TERS (tip-enhanced Raman spectroscopy) and TEPL (tip-enhanced photoluminescence) provide a unique capability for the characterization of diverse 0D, 1D and 2D materials. We will demonstrate the power and importance of the cross-correlation of nanoscale hyperspectal imaging with data from other scanning-probe techniques such as topography, surface potential, conductivity and photocurrent. We will also discuss how we have extended this technique to other nano-materials as well as semiconducting nanostructures and bio-materials.

Speaker Biography
Marc Chaigneau received his PhD in solid-state physics from the University of Nantes in 2007. He joined the PICM lab (the Laboratory of Physics of Interfaces and Thin Films) at Ecole Polytechnique as a postdoctoral associate in 2008 and was appointed tenured researcher in 2010. His research activities were concentrated on the instrumental development of Tip-Enhanced Raman spectroscopy (TERS, aka NanoRaman) and stimulated TERS, as well as its application in strain measurements in semiconductors, nano-objects (CNTs, graphene) and the investigation of organic molecules at the nanoscale. A coordinator of national funded projects, Marc Chaigneau is the author of three patents, one book chapter and more than 50 articles in peer-reviewed journals. He received the ASTRE (Actions of Support for Technology and Research in Essonne) Prize in 2013. Marc Chaigneau joined HORIBA Scientific in 2015 to oversee development, applications and worldwide marketing of Raman spectroscopy products coupled with Scanning Probe Microscopy (SPM) for TERS. He received the IP Award from the HORIBA group for innovative intellectual property in 2016.