@article{Ragazzon2022,

title = {The Generalized Lyapunov Demodulator: High-Bandwidth, Low-Noise Amplitude and Phase Estimation},

author = {M. R. P. Ragazzon and S. Messineo and J. T. Gravdahl and D. M. Harcombe and M. G. Ruppert},

doi = {10.1109/OJCSYS.2022.3181111},

year  = {2022},

date = {2022-06-08},

urldate = {2022-06-08},

journal = {IEEE Open Journal of Control Systems},

abstract = {Effective demodulation of amplitude and phase is a requirement in a wide array of applications. Recent efforts have increased the demodulation performance, in particular, the Lyapunov demodulator allows bandwidths up to the carrier frequency of the signal. However, being inherently restricted to first-order filtering of the input signal, it is highly sensitive to frequency components outside its passband region. This makes it unsuitable for certain applications such as multifrequency atomic force microscopy (AFM). In this article, the structure of the Lyapunov demodulator is transformed to an equivalent form and generalized by exploiting the internal model principle. The resulting generalized Lyapunov demodulator structure allows for arbitrary filtering order and is easy to implement, requiring only a bandpass filter, a single integrator, and two nonlinear transformations. The generalized Lyapunov demodulator is implemented experimentally on a field-programmable gate array (FPGA). Then it is used for imaging in an AFM and benchmarked against the standard Lyapunov demodulator and the widely used lock-in amplifier. The lock-in amplifier achieves great noise attenuation capabilities and off-mode rejection at low bandwidths, whereas the standard Lyapunov demodulator is shown to be effective at high bandwidths. We demonstrate that the proposed demodulator combines the best from the two state-of-the-art demodulators, demonstrating high bandwidths, large off-mode rejection, and excellent noise attenuation simultaneously.},

keywords = {},

pubstate = {published},

tppubtype = {article}

}

@article{nokey,

title = {Tuning the enzyme-like activities of cerium oxide nanoparticles using a triethyl phosphite ligand},

author = {N. Yadav and V. Patel and L. McCourt and M. G. Ruppert and M. Miller and T. Inerbaev and S. Mahasivam and V. Bansal and A. Vinu and S. Singh and A. Karakoti},

doi = {10.1039/d2bm00396a},

year  = {2022},

date = {2022-04-22},

journal = {Royal Society of Chemistry: Biomaterials Science},

abstract = {Cerium oxide nanoparticles (CeNPs) exhibit excellent in vitro and in vivo antioxidant properties, determined by the redox switching of surface cerium ions between their two oxidation states (Ce3+ and Ce4+). It is known that ligands such as triethyl phosphite (TEP) can tune the redox behavior of CeNPs and change their biological enzyme-mimetic activities; however, the corresponding mechanism for such a behavior is completely unknown. Herein, we have studied the effect of TEP in promoting the SOD-enzyme-like activity in CeNPs with high and low Ce3+/Ce4+ ratio, which were synthesized by wet chemical and thermal hydrolysis methods, respectively, and incubated with varying concentrations of TEP. X-ray diffraction, UV-visible, photoluminescence, X-ray photoelectron spectroscopy, and Raman spectroscopy combined with DFT calculations were used to investigate the interaction of TEP on the surface of CeNPs. We observed a clear correlation between TEP concentration and the formation of surface oxygen vacancies. XPS analysis confirmed the increase in Ce3+ concentration after interaction with TEP. Moreover, we show that TEP's influence depends on the surface Ce3+/Ce4+ ratio. The superoxide dismutase-, catalase-, and oxidase-like activities of CeNPs with high Ce3+/Ce4+ ratio are not affected by TEP interaction, whereas catalase- and oxidase-like activities of CeNPs with low Ce3+/Ce4+ ratio decrease and the SOD-like activity is found to increase upon incubation with different concentrations of TEP. We also demonstrate that TEP interaction does not affect the regeneration of the CeNP surface, while the DFT calculations show that TEP facilitates the formation of defects on the surface of stoichiometric cerium oxide by reducing the oxygen vacancy formation energy. CeNPs with low Ce3+/Ce4+ ratio incubated with TEP also exhibited good antibacterial activity as compared to the CeNPs or TEP alone.},

keywords = {},

pubstate = {published},

tppubtype = {article}

}

@article{nokey,

title = {Chemical bond imaging using torsional and flexural higher eigenmodes of qPlus sensors},

author = {D. Martin-Jimenez and M. G. Ruppert and A. Ihle and S. Ahles and H. A. Wegner and A. Schirmeisen and D. Ebeling},

url = {https://www.precisionmechatronicslab.com/wp-content/uploads/2022/04/Nanoscale-2022-Martin-Jimenez-bond-imaging-with-torsional-and-flexural-higher-eigenmodes.pdf},

doi = {10.1039/d2nr01062c},

year  = {2022},

date = {2022-03-23},

urldate = {2022-03-23},

journal = {Nanoscale - The Royal Society of Chemistry},

volume = {14},

number = {14},

pages = {5251-5628},

abstract = {Non-contact atomic force microscopy (AFM) with CO-functionalized tips allows to visualize the chemical structure of adsorbed molecules and identify individual inter- and intramolecular bonds. This technique enables in-depth studies of on-surface reactions and self-assembly processes. Herein, we analyze the suitability of qPlus sensors, which are commonly used for such studies, for the application of modern multifrequency AFM techniques. Two different qPlus sensors were tested for submolecular resolution imaging via actuating torsional and flexural higher eigenmodes and via bimodal AFM. The torsional eigenmode of one of our sensors is perfectly suited for performing lateral force microscopy (LFM) with single bond resolution. The obtained LFM images agree well with images from the literature, which were scanned with customized qPlus sensors that were specifically designed for LFM. The advantage of using a torsional eigenmode is that the same molecule can be imaged either with a vertically or laterally oscillating tip without replacing the sensor simply by actuating a different eigenmode. Submolecular resolution is also achieved by actuating the 2nd flexural eigenmode of our second sensor. In this case, we observe particular contrast features that only appear in the AFM images of the 2nd flexural eigenmode but not for the fundamental eigenmode. With complementary laser Doppler vibrometry measurements and AFM simulations we can rationalize that these contrast features are caused by a diagonal (i.e. in-phase vertical and lateral) oscillation of the AFM tip.},

keywords = {},

pubstate = {published},

tppubtype = {article}

}

@article{J22a,

title = {Simultaneous tip force and displacement sensing for AFM cantilevers with on-chip actuation: Design and characterization for off-resonance tapping mode},

author = {N. F. S. de Bem and M. G. Ruppert and A. J. Fleming and Y. K. Yong},

url = {https://www.precisionmechatronicslab.com/wp-content/uploads/2022/03/J22a.pdf},

doi = {10.1016/j.sna.2022.113496},

issn = {0924-4247},

year  = {2022},

date = {2022-03-08},

urldate = {2022-03-08},

journal = {Sensors and Actuators A: Physical},

volume = {338},

pages = {113496},

abstract = {The use of integrated on-chip actuation simplifies the identification of a cantilever resonance, can improve imaging speed, and enables the use of smaller cantilevers, which is required for low-force imaging at high speed. This article describes a cantilever with on-chip actuation and novel dual-sensing capabilities for AFM. The dual-sensing configuration allows for tip displacement and tip force to be measured simultaneously. A mathematical model is developed and validated with finite element analysis. A physical prototype is presented, and its calibration and validation are presented. The cantilever is optimized for use in off-resonance tapping modes. Experimental results demonstrate an agreement between the on-chip sensors and external force and displacement measurements.},

keywords = {},

pubstate = {published},

tppubtype = {article}

}

@article{Ruppert2022,

title = {Experimental Analysis of Tip Vibrations at Higher Eigenmodes of QPlus Sensors for Atomic Force Microscopy},

author = {M. G. Ruppert and D. Martin-Jimenez and Y. K. Yong and A. Ihle and A. Schirmeisen and A. J. Fleming and D. Ebeling},

url = {https://www.precisionmechatronicslab.com/wp-content/uploads/2022/03/J22c.pdf},

doi = {10.1088/1361-6528/ac4759},

issn = {1361-6528},

year  = {2022},

date = {2022-02-10},

urldate = {2022-02-10},

journal = {Nanotechnology},

volume = {33},

issue = {18},

pages = {185503},

abstract = {QPlus sensors are non-contact atomic force microscope probes constructed from a quartz tuning fork and a tungsten wire with an electrochemically etched tip. These probes are self-sensing and offer an atomic-scale spatial resolution. Therefore, qPlus sensors are routinely used to visualize the chemical structure of adsorbed organic molecules via the so-called bond imaging technique. This is achieved by functionalizing the AFM tip with a single CO molecule and exciting the sensor at the first vertical cantilever resonance mode. Recent work using higher-order resonance modes has also resolved the chemical structure of single organic molecules. However, in these experiments, the image contrast can differ significantly from the conventional bond imaging contrast, which was suspected to be caused by unknown vibrations of the tip. This work investigates the source of these artefacts by using a combination of mechanical simulation and laser vibrometry to characterize a range of sensors with different tip wire geometries. The results show that increased tip mass and length cause increased torsional rotation of the tuning fork beam due to the off-center mounting of the tip wire, and increased flexural vibration of the tip. These undesirable motions cause lateral deflection of the probe tip as it approaches the sample, which is rationalized to be the cause of the different image contrast. The results also provide a guide for future probe development to reduce these issues.},

keywords = {},

pubstate = {published},

tppubtype = {article}

}

@article{Fleming2022,

title = {Piezoelectric Benders with Strain Sensing Electrodes: Sensor Design for Position Control and Force Estimation},

author = {R. Seethaler and S. Z. Mansour and M. G. Ruppert and A. J. Fleming},

url = {https://www.precisionmechatronicslab.com/wp-content/uploads/2022/03/J22b.pdf},

doi = {https://doi.org/10.1016/j.sna.2022.113384},

issn = {0924-4247},

year  = {2022},

date = {2022-01-22},

urldate = {2022-01-22},

journal = {Sensors and Actuators A: Physical},

volume = {335},

pages = {113384},

abstract = {Piezoelectric benders are widely used in industrial applications due to their low-cost and compact size. However, due to the large relative size and cost of displacement sensors, bender actuators are often operated in open-loop or with feed-forward control, which can limit positioning accuracy to 20% of full-scale. To improve the positioning accuracy of piezoelectric benders, this article proposes integrating resistive strain gauges into the electrode surface by chemical etching or laser ablation. These strain sensors are then used to measure and control the tip displacement. The proposed sensors are shown to suffer from significant cross-coupling between the actuator voltage and measured signal; however, this can be mitigated by judicious choice of the sensor location and actuator driving scheme. In addition to position sensing, a method is also presented for simultaneous estimation of the contact force between the actuator tip and load. The proposed methods are validated experimentally by controlling the tip position of a piezoelectric bender while simultaneously estimating the force applied to a reference load cell.},

keywords = {},

pubstate = {published},

tppubtype = {article}

}

@article{J21e,

title = {Position and force sensing using strain gauges integrated into piezoelectric bender electrodes},

author = {R. Seethaler and S. Z. Mansour and M. G. Ruppert and A. J. Fleming},

url = {https://www.precisionmechatronicslab.com/wp-content/uploads/2022/03/J21e-1.pdf},

doi = {10.1016/j.sna.2020.112416},

isbn = {0924-4247},

year  = {2021},

date = {2021-04-15},

urldate = {2020-12-30},

journal = {Sensors and Actuators A: Physical},

volume = {321},

pages = {112416},

abstract = {This article derives design guidelines for integrating strain gauges into the electrodes of piezoelectric bending actuators. The proposed sensor can estimate the actuator tip displacement in response to an applied voltage and an external applied tip force. The actuator load force is also estimated with an accuracy of 8% full scale by approximating the actuator response with a linear model. The applications of this work include micro-grippers and pneumatic valves, which both require the measurement of deflection and load force. At present, this is achieved by external sensors. However, this work shows that these functions can be integrated into the actuator electrodes.},

keywords = {},

pubstate = {published},

tppubtype = {article}

}

@article{Ruppert2021,

title = {Active atomic force microscope cantilevers with integrated device layer piezoresistive sensors},

author = {M. G. Ruppert and A. J. Fleming and Y. K. Yong},

url = {https://www.precisionmechatronicslab.com/wp-content/uploads/2021/01/J21a.pdf},

doi = {10.1016/j.sna.2020.112519},

issn = {0924-4247},

year  = {2021},

date = {2021-01-19},

urldate = {2021-01-19},

journal = {Sensors & Actuators: A. Physical},

volume = {319},

pages = {112519},

abstract = {Active atomic force microscope cantilevers with on-chip actuation and sensing provide several advantages over

passive cantilevers which rely on piezoacoustic base-excitation and optical beam deflection measurement. Active

microcantilevers exhibit a clean frequency response, provide a path-way to miniturization and parallelization and

avoid the need for optical alignment. However, active microcantilevers are presently limited by the feedthrough

between actuators and sensors, and by the cost associated with custom microfabrication. In this work, we propose

a hybrid cantilever design with integrated piezoelectric actuators and a piezoresistive sensor fabricated from the

silicon device layer without requiring an additional doping step. As a result, the design can be fabricated using a

commercial five-mask microelectromechanical systems fabrication process. The theoretical piezoresistor sensitivity

is compared with finite element simulations and experimental results obtained from a prototype device. The

proposed approach is demonstrated to be a promising alternative to conventional microcantilever actuation and

deflection sensing},

keywords = {},

pubstate = {published},

tppubtype = {article}

}

@article{McCourt2020,

title = {A comparison of gold and silver nanocones and geometry optimisation for tip-enhanced microscopy},

author = {L. McCourt and M. G. Ruppert and B. S. Routley and S. Indirathankam and A. J. Fleming},

url = {https://www.precisionmechatronicslab.com/wp-content/uploads/2020/09/J20e.pdf},

doi = {https://doi.org/10.1002/jrs.5987},

year  = {2020},

date = {2020-11-01},

urldate = {2020-08-24},

journal = {Journal of Raman Spectroscopy},

volume = {51},

issue = {11},

pages = {2208-2216},

abstract = {In this article, boundary element method simulations are used to optimise the geometry of silver and gold nanocone probes to maximise the localised electric field enhancement and tune the near-field resonance wavelength. These objectives are expected to maximise the sensitivity of tip-enhanced Raman microscopes. Similar studies have used limited parameter sets or used a performance metric other than localised electric field enhancement. In this article, the optical responses for a range of nanocone geometries are simulated for excitation wavelengths ranging from 400 to 1000 nm. Performance is evaluated by measuring the electric field enhancement at the sample surface with a resonant illumination wavelength. These results are then used to determine empirical models and derive optimal nanocone geometries for a particular illumination wavelength and tip material. This article concludes that gold nanocones are expected to provide similar performance to silver nanocones at red and nearinfrared wavelengths, which is consistent with other results in the literature. In this article, 633 nm is determined to be the shortest usable illumination wavelength for gold nanocones. Below this limit, silver nanocones will provide superior enhancement. The use of gold nanocone probes is expected to dramatically improve probe lifetime, which is currently measured in hours for silver coated probes. Furthermore, the elimination of passivation coatings is expected to enable smaller probe radii and improved topographical resolution.},

keywords = {},

pubstate = {published},

tppubtype = {article}

}

@article{Ruppert2020,

title = {Amplitude Noise Spectrum of a Lock-in Amplifier: Application to Microcantilever Noise Measurements},

author = {M. G. Ruppert and N. J. Bartlett and Y. K. Yong and A. J. Fleming},

url = {https://www.precisionmechatronicslab.com/wp-content/uploads/2020/09/J20f.pdf},

doi = {10.1016/j.sna.2020.112092},

year  = {2020},

date = {2020-05-29},

journal = {Sensors and Actuators A: Physical},

volume = {312},

pages = {112092},

abstract = {The lock-in amplifier is a crucial component in many applications requiring high-resolution displacement sensing; it's purpose is to estimate the amplitude and phase of a periodic signal, potentially corrupted by noise, at a frequency determined by a reference signal. Where the noise can be approximated by a stationary Gaussian process, such as thermal force noise and electronic sensor noise, this article derives the amplitude noise spectral density of the lock-in-amplifier output. The proposed method is demonstrated by predicting the demodulated noise spectrum of a microcantilever for dynamic-mode atomic force microscopy to determine the cantilever on-resonance thermal noise, the cantilever tracking bandwidth and the electronic noise floor. The estimates are shown to closely match experimental results over a wide range of operating conditions.},

keywords = {},

pubstate = {published},

tppubtype = {article}

}

@article{Moore2020,

title = {AFM Cantilever Design for Multimode Q Control: Arbitrary Placement of Higher-Order Modes},

author = {S. I. Moore and M. G. Ruppert and Y. K. Yong},

url = {https://ieeexplore.ieee.org/document/9006926},

doi = {10.1109/TMECH.2020.2975627},

year  = {2020},

date = {2020-02-21},

journal = { IEEE/ASME Transactions on Mechatronics},

pages = {1-6},

abstract = {In the fast growing field of multifrequency atomic force microscopy (AFM), the benefits of using higher-order modes has been extensively reported on. However, higher modes of AFM cantilevers are difficult to instrument and Q control is challenging owing to their high frequency nature. At these high frequencies, the latencies in the computations and analog conversions of digital signal processing platforms become significant and limit the effective bandwidth of digital feedback controller implementations. To address this issue, this article presents a novel cantilever design for which the first five modes are placed within a 200 kHz bandwidth. The proposed cantilever is designed using a structural optimization routine. The close spacing and low mechanical bandwidth of the resulting cantilever allows for the implementation of Q controllers for all five modes using a standard FPGA development board for bimodal AFM and imaging on higher-order modes.},

note = {Early Access},

keywords = {},

pubstate = {published},

tppubtype = {article}

}

@article{Harcombe2020,

title = {A review of demodulation techniques for multifrequency atomic force microscopy},

author = {D. M. Harcombe and M. G. Ruppert and A. J. Fleming},

editor = {T. Glatzel},

url = {https://www.precisionmechatronicslab.com/wp-content/uploads/2020/02/J20b-reducedSize.pdf},

doi = {doi:10.3762/bjnano.11.8},

issn = {21904286},

year  = {2020},

date = {2020-01-07},

journal = {Beilstein Journal of Nanotechnology},

volume = {11},

pages = {76-97},

abstract = {This article compares the performance of traditional and recently proposed demodulators for multifrequency atomic force microscopy. The compared methods include the lock-in amplifier, coherent demodulator, Kalman filter, Lyapunov filter, and direct-design demodulator. Each method is implemented on a field-programmable gate array (FPGA) with a sampling rate of 1.5 MHz. The metrics for comparison include the sensitivity to other frequency components and the magnitude of demodulation artifacts for a range of demodulator bandwidths. Performance differences are demonstrated through higher harmonic atomic force microscopy imaging.},

keywords = {},

pubstate = {published},

tppubtype = {article}

}

@article{Wang2019b,

title = {Scan Rate Adaptation for AFM Imaging Based on Performance Metric Optimisation},

author = {K. Wang and M. G. Ruppert and C. Manzie and D. Nesic and Y. K. Yong },

url = {https://ieeexplore.ieee.org/document/8867937},

doi = {10.1109/TMECH.2019.2947203},

year  = {2019},

date = {2019-10-14},

journal = { IEEE/ASME Transactions on Mechatronics},

abstract = {Constant-force contact-mode atomic force microscopy (AFM) relies on a feedback control system to regulate the tip-sample interaction during imaging. Due to limitations in actuators and control, the bandwidth of the regulation system is typically small. Therefore, the scan rate is usually limited in order to guarantee a desirable image quality for a constant-rate scan. By adapting the scan rate online, further performance improvement is possible, and the conditions to this improvement has been explored qualitatively in a previous study for a wide class of possible scan patterns. In this paper, a quantitative assessment of the previously proposed adaptive scan scheme is investigated through experiments that explore the impact of various degrees of freedom in the algorithm. Further modifications to the existing scheme are proposed and shown to improve the closed-loop performance. The flexibility of the proposed approach is further demonstrated by applying the algorithm to tapping-mode AFM.},

note = {early access},

keywords = {},

pubstate = {published},

tppubtype = {article}

}

@article{Moore2019c,

title = {An optimization framework for the design of piezoelectric AFM cantilevers},

author = {S. I. Moore and M. G. Ruppert and Y. K. Yong},

url = {https://www.sciencedirect.com/science/article/pii/S0141635919302260},

year  = {2019},

date = {2019-08-15},

journal = {Precision Engineering},

volume = {60},

pages = {130-142},

abstract = {To facilitate further miniaturization of atomic force microscopy (AFM) cantilevers and to eliminate the standard optical beam deflection sensor, integrated piezoelectric actuation and sensing on the chip level is a promising option. This article presents a topology optimization method for dynamic mode AFM cantilevers that maximizes the sensitivity of an integrated piezoelectric sensor under stiffness and resonance frequency constraints. Included in the formulation is a new material model C-SIMP (connectivity and solid isotropic material with penalization) that extends the SIMP model to explicitly include the penalization of unconnected structures. Example cantilever designs demonstrate the potential of the topology optimization method. The results show, firstly, the C-SIMP material model significantly reduces connectivity issues and, secondly, arbitrary cantilever topologies can produce increases in sensor sensitivity or resonance frequency compared to a rectangular topology.},

keywords = {},

pubstate = {published},

tppubtype = {article}

}

@article{Moore2019,

title = {Design and Analysis of Low-Distortion Demodulators for Modulated Sensors},

author = { S. I. Moore and M. G. Ruppert and D. M. Harcombe and A. J. Fleming and Y. K. Yong },

url = {https://www.precisionmechatronicslab.com/wp-content/uploads/2020/05/J19d-reduced.pdf},

doi = {10.1109/TMECH.2019.2928592},

issn = {10834435},

year  = {2019},

date = {2019-07-17},

journal = {IEEE/ASME Transactions on Mechatronics},

volume = {24},

number = {4},

pages = {1861-1870},

abstract = {System-based demodulators in the form of a Kalman and Lyapunov filter have been demonstrated to significantly outperform traditional demodulators, such as the lock-in amplifier, in bandwidth sensitive applications, for example high-speed atomic force microscopy. Building on their closed loop architecture, this article describes a broader class of high-speed closed-loop demodulators. The generic structure provides greater flexibility to independently control the bandwidth and sensitivity to out-of-band frequencies. A linear time-invariant description is derived which allows the utilization of linear control theory to design the demodulator. Experimental results on a nanopositioner with capacitive sensors demonstrate the realization of arbitrary demodulator dynamics while achieving excellent noise rejection.},

keywords = {},

pubstate = {published},

tppubtype = {article}

}

@article{Wang2019,

title = {Adaptive Scan for Atomic Force Microscopy Based on Online Optimisation: Theory and Experiment},

author = {K. Wang and M. G. Ruppert and C. Manzie and D. Nesic and Y. K. Yong},

url = {https://ieeexplore.ieee.org/document/8643730},

year  = {2019},

date = {2019-01-31},

journal = {IEEE Transactions on Control System Technology},

abstract = {A major challenge in Atomic Force Microscopy

(AFM) is to reduce the scan duration while retaining the

image quality. Conventionally, the scan rate is restricted to a

sufficiently small value in order to ensure a desirable image

quality as well as a safe tip-sample contact force. This usually

results in a conservative scan rate for samples that have a

large variation in aspect ratio and/or for scan patterns that

have a varying linear velocity. In this paper, an adaptive scan

scheme is proposed to alleviate this problem. A scan line-based

performance metric balancing both imaging speed and accuracy

is proposed, and the scan rate is adapted such that the metric

is optimised online in the presence of aspect ratio and/or linear

velocity variations. The online optimisation is achieved using an

extremum-seeking (ES) approach, and a semi-global practical

asymptotic stability (SGPAS) result is shown for the overall

system. Finally, the proposed scheme is demonstrated via both

simulation and experiment.},

note = {accepted for publication},

keywords = {},

pubstate = {published},

tppubtype = {article}

}

@article{Ruppert2018b,

title = {Multimodal atomic force microscopy with optimized higher eigenmode sensitivity using on-chip piezoelectric actuation and sensing},

author = {M. G. Ruppert and S. I. Moore and M. Zawierta and A. J. Fleming and G. Putrino and Y. K. Yong},

url = {https://www.precisionmechatronicslab.com/wp-content/uploads/2019/08/Ruppert_2019_Nanotechnology_30_085503.pdf},

doi = {https://doi.org/10.1088/1361-6528/aae40b},

year  = {2019},

date = {2019-01-02},

journal = {Nanotechnology},

volume = {30},

number = {8},

pages = {085503},

abstract = {Atomic force microscope (AFM) cantilevers with integrated actuation and sensing provide several distinct advantages over conventional cantilever instrumentation. These include clean frequency responses, the possibility of down-scaling and parallelization to cantilever arrays as well as the absence of optical interference. While cantilever microfabrication technology has continuously advanced over the years, the overall design has remained largely unchanged; a passive rectangular shaped cantilever design has been adopted as the industry wide standard. In this article, we demonstrate multimode AFM imaging on higher eigenmodes as well as bimodal AFM imaging with cantilevers using fully integrated piezoelectric actuation and sensing. The cantilever design maximizes the higher eigenmode deflection sensitivity by optimizing the transducer layout according to the strain mode shape. Without the need for feedthrough cancellation, the read-out method achieves close to zero actuator/sensor feedthrough and the sensitivity is sufficient to resolve the cantilever Brownian motion.},

keywords = {},

pubstate = {published},

tppubtype = {article}

}

@article{Ruppert2018b,

title = {Self-sensing, estimation and control in multifrequency Atomic Force Microscopy. },

author = {M. G. Ruppert},

url = {https://royalsoc.org.au/images/pdf/journal/151-1-Ruppert.pdf},

issn = {0035-9173/18/010111-01},

year  = {2018},

date = {2018-06-01},

journal = {Journal & Proceedings of the Royal Society of New South Wales},

volume = {151},

number = {1},

pages = {111},

abstract = {Despite the undeniable success of the atomic force  microscope  (AFM),  dynamic  techniques still face limitations in terms of spatial resolution, imaging speed and high cost of acquisition. In order to expand the capabilities  of  the  instrument,  it  was  realized  that the information about the nano-mechanical properties  of  a  sample  are  encoded  over  a range of frequencies and the excitation and detection of higher-order eigenmodes of the micro-cantilever  open  up  further  informa-

tion  channels.  The  ability  to  control  these modes and their fast responses to excitation is believed to be the key to unravelling the true potential of these ethods. This work addresses  three  major  drawbacks  of  the standard AFM setup, which limit the feasibility of multi-frequency approaches.



First,   microelectromechanical   system (MEMS)  probes  with  integrated  piezoelectric layers is motivated, enabling the development of novel multimode self-sensing and self-actuating techniques. Specifically, these piezoelectric  transduction  schemes  permit the  miniaturization  of  the  entire  AFM towards  a  cost-effective  single-chip  device with nanoscale precision in a much smaller form factor than that of conventional macroscale instruments.



Second, the integrated actuation enables the development of multimode controllers which  exhibits  remarkable  performance  in arbitrarily  modifying  the  quality  factor  of multiple eigenmodes and comes with inherent  stability  robustness.  The  experimental results  demonstrate  improved  imaging  stability,  higher  scan  speeds  and  adjustable contrast  when  mapping  nano-mechanical properties of soft samples. 



Last, in light of the demand for constantly increasing  imaging  speeds  while  providing multi-frequency flexibility, the estimation of multiple components of the high-frequency deflection signal is performed with a linear time-varying multi-frequency Kalman filter. The chosen representation allows for an efficient high-bandwidth implementation on a Field  Programmable  Gate  Array. Tracking bandwidth, noise performance and trimodal AFM imaging on a two-component polymer sample  are  verified  and  shown  to  be  superior to that of the commonly used lock-in amplifier.},

keywords = {},

pubstate = {published},

tppubtype = {article}

}

@article{J18c,

title = {Lyapunov Estimation for High-Speed Demodulation in Multifrequency Atomic Force Microscopy},

author = {D. M. Harcombe and M. G. Ruppert and M. R. P. Ragazzon and A. J. Fleming},

url = {https://www.precisionmechatronicslab.com/wp-content/uploads/2018/02/J18c.pdf},

doi = {10.3762/bjnano.9.47},

issn = {21904286},

year  = {2018},

date = {2018-02-28},

journal = {Beilstein Journal of Nanotechnology},

volume = {9},

pages = {490-498},

abstract = {An important issue in the emerging field of multifrequency atomic force microscopy (MF-AFM) is the accurate and fast demodulation of the cantilever-tip deflection signal. As this signal consists of multiple frequency components and noise processes, a lock-in amplifier is typically employed for its narrowband response. However, this demodulator suffers inherent bandwidth limitations as high frequency mixing products must be filtered out and several must be operated in parallel. Many MF-AFM methods require amplitude and phase demodulation at multiple frequencies of interest, enabling both z-axis feedback and phase contrast imaging to be achieved. This article proposes a model-based multifrequency Lyapunov filter implemented on a Field Programmable Gate Array (FPGA) for high-speed MF-AFM demodulation. System descriptions and simulations are verified by experimental results demonstrating high tracking bandwidths, strong off-mode rejection and minor sensitivity to cross-coupling effects. Additionally, a five-frequency system operating at 3.5MHz is implemented for higher harmonic amplitude and phase imaging up to 1MHz.},

keywords = {},

pubstate = {published},

tppubtype = {article}

}

@article{J17h,

title = {A Review of Demodulation Techniques for Amplitude Modulation Atomic Force Microscopy},

author = {M. G. Ruppert and D. M. Harcombe and M. R. P. Ragazzon and S. O. R. Moheimani and A. J. Fleming},

url = {https://www.precisionmechatronicslab.com/wp-content/uploads/2020/08/2190-4286-8-142.pdf},

doi = {10.3762/bjnano.8.142},

year  = {2017},

date = {2017-09-01},

journal = {Bellstein Journal of Nanotechnology},

volume = {8},

pages = {1407–1426},

abstract = {In this review paper, traditional and novel demodulation methods applicable to amplitude modulation atomic force microscopy are implemented on a widely used digital processing system. As a crucial bandwidth-limiting component in the z-axis feedback loop of an atomic force microscope, the purpose of the demodulator is to obtain estimates of amplitude and phase of the cantilever deflection signal in the presence of sensor noise or additional distinct frequency components. Specifically for modern multifrequency techniques, where higher harmonic and/or higher eigenmode contributions are present in the oscillation signal, the fidelity of the estimates obtained from some demodulation techniques is not guaranteed. To enable a rigorous comparison, the performance metrics tracking bandwidth, implementation complexity and sensitivity to other frequency components are experimentally evaluated for each method. Finally, the significance of an adequate demodulator bandwidth is highlighted during high-speed tapping-mode AFM experiments in constant height mode.},

keywords = {},

pubstate = {published},

tppubtype = {article}

}

@article{Ruppert2017b,

title = {Note: Guaranteed collocated multimode control of an atomic force microscope cantilever using on-chip piezoelectric actuation and sensing},

author = {M. G. Ruppert and Y. K. Yong},

url = {https://www.precisionmechatronicslab.com/wp-content/uploads/2017/08/2017_JNote_RSI_Vol88_086109-2.pdf},

doi = {10.1063/1.4990451},

year  = {2017},

date = {2017-08-15},

journal = {Review of Scientific Instruments},

volume = {88},

number = {086109},

abstract = {The quality (Q) factor is an important parameter of the resonance of the microcantilever as it determines

both imaging bandwidth and force sensitivity. The ability to control the Q factor of multiple

modes is believed to be of great benefit for atomic force microscopy techniques involving multiple

eigenmodes. In this paper, we propose a novel cantilever design employing multiple piezoelectric

transducers which are used for separated actuation and sensing, leading to guaranteed collocation

of the first eight eigenmodes up to 3 MHz. The design minimizes the feedthrough usually observed

with these systems by incorporating a guard trace on the cantilever chip. As a result, a multimode

Q controller is demonstrated to be able to modify the quality factor of the first two eigenmodes over

up to four orders of magnitude without sacrificing robust stability.},

keywords = {},

pubstate = {published},

tppubtype = {article}

}

@article{J17e,

title = {Lyapunov Estimator for High-Speed Demodulation in Dynamic Mode Atomic Force Microscopy},

author = {M. R. P. Ragazzon and M. G. Ruppert and D. M. Harcombe and A. J. Fleming and J. T. Gravdahl},

url = {https://www.precisionmechatronicslab.com/wp-content/uploads/2017/09/J17e.pdf},

year  = {2017},

date = {2017-08-01},

journal = {IEEE Transactions on Control Systems Technology},

volume = {26},

number = {2},

pages = {765-772},

abstract = {In dynamic mode atomic force microscopy (AFM), the imaging bandwidth is governed by the slowest component in the open-loop chain consisting of the vertical actuator, cantilever and demodulator. While the common demodulation method is to use a lock-in amplifier (LIA), its performance is ultimately bounded by the bandwidth of the post-mixing low-pass filters. This article proposes an amplitude and phase estimation method based on a strictly positive real Lyapunov design approach. The estimator is designed to be of low complexity while allowing for high bandwidth. Additionally, suitable gains for high performance are suggested such that no tuning is necessary. The Lyapunov estimator is experimentally implemented for amplitude demodulation and shown to surpass the LIA in terms of tracking bandwidth and noise performance. High-speed AFM images are presented to corroborate the results.},

keywords = {},

pubstate = {published},

tppubtype = {article}

}