Publications

@article{Ruppert2021,

title = {Active atomic force microscope cantilevers with integrated device layer piezoresistive sensors},

author = {M. G. Ruppert and A. J. Fleming and Y. K. Yong},

url = {https://www.precisionmechatronicslab.com/wp-content/uploads/2021/01/J21a.pdf},

doi = {10.1016/j.sna.2020.112519},

issn = {0924-4247},

year  = {2021},

date = {2021-01-19},

urldate = {2021-01-19},

journal = {Sensors & Actuators: A. Physical},

volume = {319},

pages = {112519},

abstract = {Active atomic force microscope cantilevers with on-chip actuation and sensing provide several advantages over

passive cantilevers which rely on piezoacoustic base-excitation and optical beam deflection measurement. Active

microcantilevers exhibit a clean frequency response, provide a path-way to miniturization and parallelization and

avoid the need for optical alignment. However, active microcantilevers are presently limited by the feedthrough

between actuators and sensors, and by the cost associated with custom microfabrication. In this work, we propose

a hybrid cantilever design with integrated piezoelectric actuators and a piezoresistive sensor fabricated from the

silicon device layer without requiring an additional doping step. As a result, the design can be fabricated using a

commercial five-mask microelectromechanical systems fabrication process. The theoretical piezoresistor sensitivity

is compared with finite element simulations and experimental results obtained from a prototype device. The

proposed approach is demonstrated to be a promising alternative to conventional microcantilever actuation and

deflection sensing},

keywords = {AFM, Cantilever, MEMS, Sensors, Smart Structures},

pubstate = {published},

tppubtype = {article}

}

@article{Moore2019,

title = {Capacitive Instrumentation and Sensor Fusion for High-Bandwidth Nanopositioning},

author = {S. I. Moore and A. J. Fleming and Y. K. Yong},

url = {https://www.precisionmechatronicslab.com/wp-content/uploads/2019/10/J19c.pdf},

doi = {10.1109/LSENS.2019.2933065},

isbn = {2475-1472},

year  = {2019},

date = {2019-09-09},

journal = {IEEE Sensor Letters},

volume = {3},

number = {8},

pages = {2501503},

abstract = {Precision capacitive sensing methods encode the measurement in a high frequency signal, which requires demodulation. To extract the measurement, the signal is observed over many cycles limiting the bandwidth of the sensor and introducing an undesirable phase lag. To address this limitation, this article outlines a design, which fuses the output of a standard modulated capacitive sensor and a charge amplifier, providing an instantaneous capacitive measurement whose bandwidth is only limited by the speed at which the electronics operate.},

keywords = {Nanopositioning, Sensors},

pubstate = {published},

tppubtype = {article}

}

@article{Ruppert2018b,

title = {Multimodal atomic force microscopy with optimized higher eigenmode sensitivity using on-chip piezoelectric actuation and sensing},

author = {M. G. Ruppert and S. I. Moore and M. Zawierta and A. J. Fleming and G. Putrino and Y. K. Yong},

url = {https://www.precisionmechatronicslab.com/wp-content/uploads/2019/08/Ruppert_2019_Nanotechnology_30_085503.pdf},

doi = {https://doi.org/10.1088/1361-6528/aae40b},

year  = {2019},

date = {2019-01-02},

journal = {Nanotechnology},

volume = {30},

number = {8},

pages = {085503},

abstract = {Atomic force microscope (AFM) cantilevers with integrated actuation and sensing provide several distinct advantages over conventional cantilever instrumentation. These include clean frequency responses, the possibility of down-scaling and parallelization to cantilever arrays as well as the absence of optical interference. While cantilever microfabrication technology has continuously advanced over the years, the overall design has remained largely unchanged; a passive rectangular shaped cantilever design has been adopted as the industry wide standard. In this article, we demonstrate multimode AFM imaging on higher eigenmodes as well as bimodal AFM imaging with cantilevers using fully integrated piezoelectric actuation and sensing. The cantilever design maximizes the higher eigenmode deflection sensitivity by optimizing the transducer layout according to the strain mode shape. Without the need for feedthrough cancellation, the read-out method achieves close to zero actuator/sensor feedthrough and the sensitivity is sufficient to resolve the cantilever Brownian motion.},

keywords = {AFM, Cantilever, MEMS, Multifrequency AFM, Piezoelectric Transducers and Drives, Sensors, Smart Structures, SPM},

pubstate = {published},

tppubtype = {article}

}

@article{J15f,

title = {A Closed-Loop Phase-Locked Interferometer for Wide Bandwidth Position Sensing},

author = {A. J. Fleming and B. S. Routley},

url = {https://www.precisionmechatronicslab.com/wp-content/uploads/2015/12/J15f.pdf},

doi = {10.1063/1.4935469},

year  = {2015},

date = {2015-12-31},

journal = {Review of Scientific Instruments},

volume = {86},

pages = {115001(1-7)},

abstract = {This article describes a position sensitive interferometer with closed-loop control of the reference mirror. A calibrated nanopositioner is used to lock the interferometer phase to the most sensitive point in the interfer- ogram. In this conguration, large low-frequency movements of the sensor mirror can be detected from the control signal applied to the nanopositioner and high-frequency short-range signals can be measured directly from the photodiode. It is demonstrated that these two signals are complementary and can be summed to find the total displacement. The resulting interferometer has a number of desirable characteristics: it is optically simple, does not require polarization or modulation to detect the direction of motion, does not require fringe-counting or interpolation electronics, and has a bandwidth equal to that of the photodiode. Experimental results demonstrate the frequency response analysis of a high-speed positioning stage. The proposed instru-

ment is ideal for measuring the frequency response of nanopositioners, electro-optical components, MEMs devices, Ultrasonic devices, and sensors such as surface acoustic wave detectors.},

keywords = {Nanopositioning, Optics, Sensors},

pubstate = {published},

tppubtype = {article}

}