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2018

5.A Comparison Of Scanning Methods And The Vertical Control Implications For Scanning Probe Microscopy

Y. R. Teo, Y. K. Yong, A. J. Fleming

A Comparison Of Scanning Methods And The Vertical Control Implications For Scanning Probe Microscopy (Journal Article)

Asian Journal of Control, 30 (4), pp. 1-15, 2018.

(Abstract | Links | BibTeX | Tags: Scan Pattern, SPM)

2017

4.Combining Spiral Scanning and Internal Model Control for Sequential AFM Imaging at Video Rate

A. Bazaei, Y. K. Yong, S. O. R. Moheimani

Combining Spiral Scanning and Internal Model Control for Sequential AFM Imaging at Video Rate (Journal Article)

IEEE Transactions on Mechatronics, 22 (1), pp. 371-380, 2017.

(Abstract | Links | BibTeX | Tags: Scan Pattern, SPM)

2015

3.Internal Model Control for High-speed Spiral Scan AFM

A. Bazaei, Y. K. Yong, S. O. R. Moheimani

Internal Model Control for High-speed Spiral Scan AFM (Inproceeding)

Australian Control Conference, Gold Coast, Australia, 2015.

(BibTeX | Tags: Nanopositioning, Scan Pattern)

2012

2.Design and control of a novel non-raster scan pattern for fast scanning probe microscopy (Invited Paper)

Y. K. Yong, A. Bazaei, S. O. R. Moheimani, F. Allgower

Design and control of a novel non-raster scan pattern for fast scanning probe microscopy (Invited Paper) (Inproceeding)

IEEE/ASME International Conference on Advanced Intelligent Mechatronics, Kaohsiung, Taiwan, pp. 456-461, 2012.

(Links | BibTeX | Tags: Nanopositioning, Scan Pattern, SPM)

2011

1.

Y. K. Yong, S. O. R. Moheimani, I. R. Petersen

A Non-raster Scan Method for High-speed SPM (Inproceeding)

IEEE/ASME International Conference on Advanced Intelligent Mechatronics, Budapest, Hungary, 2011.

(BibTeX | Tags: Nanopositioning, Scan Pattern, SPM)