2020 |
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59. | N. F. S. de Bem; M. G. Ruppert; Y. K. Yong; A. J. Fleming Integrated force and displacement sensing in active microcantilevers for off-resonance tapping mode atomic force microscopy Proceedings Article In: International Conference on Manipulation, Automation and Robotics at Small Scales (MARSS), pp. 1-6, 2020. Abstract | Links | BibTeX | Tags: AFM, MEMS, SPM @inproceedings{C20c, Integrated on-chip actuation and sensing in microcantilevers for atomic force microscopy (AFM) allows faster scanning speeds, cleaner frequency responses and smaller cantilevers. However, a single integrated sensor suffers from crosscoupling between displacements originating from tip-sample forces and direct actuation. This paper addresses this issue by presenting a novel microcantilever with on-chip actuation and integrated dual sensing for AFM with application to offresonance tapping modes in AFM. The proposed system is able to measure tip force and deflection simultaneously. A mathematical model is developed for a rectangular cantilever to describe the system and is validated with finite element analysis. | |
58. | L. McCourt; M. G. Ruppert; B. S. Routley; S. Indirathankam; A. J. Fleming A comparison of gold and silver nanocones and geometry optimisation for tip-enhanced microscopy Journal Article In: Journal of Raman Spectroscopy, vol. 51, iss. 11, pp. 2208-2216, 2020. Abstract | Links | BibTeX | Tags: AFM, Cantilever, MEMS, Optics, SPM @article{McCourt2020, In this article, boundary element method simulations are used to optimise the geometry of silver and gold nanocone probes to maximise the localised electric field enhancement and tune the near-field resonance wavelength. These objectives are expected to maximise the sensitivity of tip-enhanced Raman microscopes. Similar studies have used limited parameter sets or used a performance metric other than localised electric field enhancement. In this article, the optical responses for a range of nanocone geometries are simulated for excitation wavelengths ranging from 400 to 1000 nm. Performance is evaluated by measuring the electric field enhancement at the sample surface with a resonant illumination wavelength. These results are then used to determine empirical models and derive optimal nanocone geometries for a particular illumination wavelength and tip material. This article concludes that gold nanocones are expected to provide similar performance to silver nanocones at red and nearinfrared wavelengths, which is consistent with other results in the literature. In this article, 633 nm is determined to be the shortest usable illumination wavelength for gold nanocones. Below this limit, silver nanocones will provide superior enhancement. The use of gold nanocone probes is expected to dramatically improve probe lifetime, which is currently measured in hours for silver coated probes. Furthermore, the elimination of passivation coatings is expected to enable smaller probe radii and improved topographical resolution. | |
57. | A. J. Fleming; M. G. Ruppert; B. S. Routley; L. McCourt Overcoming the Limitations of Tip Enhanced Raman Spectroscopy with Intermittent Contact AFM Conference 8th Multifrequency AFM Conference, Madrid, Spain, 2020. Abstract | BibTeX | Tags: AFM, Multifrequency AFM, Optics, SPM @conference{Fleming2020, Tip enhanced Raman spectroscopy (TERS) is a promising technique for mapping the chemical composition of surfaces with molecular scale. However, current TERS methods are limited by a number of issues including high tip-sample forces, high laser power, low topographical resolution, and short probe lifetime. As a result, TERS methods are best suited to robust samples that can tolerate high optical intensity. To overcome these issues and extend the application of TERS to delicate samples, a number of new probes andimaging modes are in development at the University of Newcastle. This talk will provide an overview of these methods and present preliminary results, including new methods for optical probe optimization and fabrication, and a new dynamic-mode AFM method to reduce contact forces and applied laser power. | |
56. | D. M. Harcombe; M. G. Ruppert; A. J. Fleming A review of demodulation techniques for multifrequency atomic force microscopy Journal Article In: Beilstein Journal of Nanotechnology, vol. 11, pp. 76-97, 2020, ISSN: 21904286. Abstract | Links | BibTeX | Tags: AFM, Demodulation, Multifrequency AFM, SPM @article{Harcombe2020, This article compares the performance of traditional and recently proposed demodulators for multifrequency atomic force microscopy. The compared methods include the lock-in amplifier, coherent demodulator, Kalman filter, Lyapunov filter, and direct-design demodulator. Each method is implemented on a field-programmable gate array (FPGA) with a sampling rate of 1.5 MHz. The metrics for comparison include the sensitivity to other frequency components and the magnitude of demodulation artifacts for a range of demodulator bandwidths. Performance differences are demonstrated through higher harmonic atomic force microscopy imaging. | |
2019 |
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55. | S. I. Moore; M. G. Ruppert; D. M. Harcombe; A. J. Fleming; Y. K. Yong Design and Analysis of Low-Distortion Demodulators for Modulated Sensors Journal Article In: IEEE/ASME Transactions on Mechatronics, vol. 24, no. 4, pp. 1861-1870, 2019, ISSN: 10834435. Abstract | Links | BibTeX | Tags: Demodulation, Multifrequency AFM, Nanopositioning, SPM @article{Moore2019, System-based demodulators in the form of a Kalman and Lyapunov filter have been demonstrated to significantly outperform traditional demodulators, such as the lock-in amplifier, in bandwidth sensitive applications, for example high-speed atomic force microscopy. Building on their closed loop architecture, this article describes a broader class of high-speed closed-loop demodulators. The generic structure provides greater flexibility to independently control the bandwidth and sensitivity to out-of-band frequencies. A linear time-invariant description is derived which allows the utilization of linear control theory to design the demodulator. Experimental results on a nanopositioner with capacitive sensors demonstrate the realization of arbitrary demodulator dynamics while achieving excellent noise rejection. | |
54. | M. G. Ruppert; B. S. Routley; A. J. Fleming; Y. K. Yong; G. E. Fantner Model-based Q Factor Control for Photothermally Excited Microcantilevers Proceedings Article In: Int. Conference on Manipulation, Automation and Robotics at Small Scales (MARSS), Helsinki, Finland, 2019, ISSN: 978-1-7281-0948-0. Abstract | Links | BibTeX | Tags: AFM, Multifrequency AFM, Sensors, Smart Structures, SPM, Vibration Control @inproceedings{Ruppert2019, Photothermal excitation of the cantilever for dynamic atomic force microscopy (AFM) modes is an attractive actuation method as it provides clean cantilever actuation leading to well-defined frequency responses. Unlike conventional piezo-acoustic excitation of the cantilever, it allows for model-based quality (Q) factor control in order to increase the cantilever tracking bandwidth for tapping-mode AFM or to reduce resonant ringing for high-speed photothermal offresonance tapping (PORT) in ambient conditions. In this work, we present system identification, controller design and experimental results on controlling the Q factor of a photothermally driven cantilever. The work is expected to lay the groundwork for future implementations for high-speed PORT imaging in ambient conditions. | |
53. | M. G. Ruppert; S. I. Moore; M. Zawierta; A. J. Fleming; G. Putrino; Y. K. Yong Multimodal atomic force microscopy with optimized higher eigenmode sensitivity using on-chip piezoelectric actuation and sensing Journal Article In: Nanotechnology, vol. 30, no. 8, pp. 085503, 2019. Abstract | Links | BibTeX | Tags: AFM, Cantilever, MEMS, Multifrequency AFM, Piezoelectric Transducers and Drives, Sensors, Smart Structures, SPM @article{Ruppert2018b, Atomic force microscope (AFM) cantilevers with integrated actuation and sensing provide several distinct advantages over conventional cantilever instrumentation. These include clean frequency responses, the possibility of down-scaling and parallelization to cantilever arrays as well as the absence of optical interference. While cantilever microfabrication technology has continuously advanced over the years, the overall design has remained largely unchanged; a passive rectangular shaped cantilever design has been adopted as the industry wide standard. In this article, we demonstrate multimode AFM imaging on higher eigenmodes as well as bimodal AFM imaging with cantilevers using fully integrated piezoelectric actuation and sensing. The cantilever design maximizes the higher eigenmode deflection sensitivity by optimizing the transducer layout according to the strain mode shape. Without the need for feedthrough cancellation, the read-out method achieves close to zero actuator/sensor feedthrough and the sensitivity is sufficient to resolve the cantilever Brownian motion. | |
2018 |
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52. | S. I. Moore; M. Omidbeike; A. J. Fleming; Y. K. Yong A monolithic serial-kinematic nanopositioner with integrated sensors and actuators Proceedings Article In: IEEE International Conference on Advanced Intelligent Mechatronics, Auckland, New Zealand, 2018. Abstract | Links | BibTeX | Tags: AFM, Nanopositioning, SPM @inproceedings{C18e, This article describes the design, modeling and simulation of a serial-kinematic nanopositioner machined from a single sheet of piezoelectric material. In this class of nanopositioners, the flexures, sensors and actuators are completely integrated into a single monolithic structure. A non-trivial electrode topology is etched into the sheet to achieve in-plane bending and displacement of the moving platform. Finite element analysis predicts a sensitivity of 18.6 nm/V in the x-axis and 18.1 nm/V in the yaxis with a voltage limit of −250V to 1000 V. The first resonance frequency is 250 Hz in the Z axis. This design enables high-speed, long-range, lateral positioning in space-limited applications. | |
51. | Y. R. Teo; Y. K. Yong; A. J. Fleming A Comparison Of Scanning Methods And The Vertical Control Implications For Scanning Probe Microscopy Journal Article In: Asian Journal of Control, vol. 30, no. 4, pp. 1-15, 2018. Abstract | Links | BibTeX | Tags: Scan Pattern, SPM @article{J18f, This article compares the imaging performance of non-traditional scanning patterns for scanning probe microscopy including sinusoidal raster, spiral, and Lissajous patterns. The metrics under consideration include the probe velocity, scanning frequency, and required sampling rate. The probe velocity is investigated in detail as this quantity is proportional to the required bandwidth of the vertical feedback loop and has a major impact on image quality. By considering a sample with an impulsive Fourier transform, the effect of scanning trajectories on imaging quality can be observed and quantified. The non-linear trajectories are found to spread the topography signal bandwidth which has important implications for both low and high-speed imaging. These effects are studied analytically and demonstrated experimentally with a periodic calibration grating. | |
50. | M. G. Ruppert; D. M. Harcombe; S. I. Moore; A. J. Fleming Direct Design of Closed-loop Demodulators for Amplitude Modulation Atomic Force Microscopy Proceedings Article In: American Control Conference, Milwaukee, WI, 2018. Abstract | Links | BibTeX | Tags: AFM, SPM @inproceedings{C18b, A fundamental component of the z-axis feedback loop in amplitude modulation atomic force microscopy is the demodulator. It dictates both bandwidth and noise in the amplitude and phase estimate of the cantilever deflection signal. In this paper, we derive a linear time-invariant model of a closedloop demodulator with user definable tracking bandwidth and sensitivity to other frequency components. A direct demodulator design method is proposed based on the reformulation of the Lyapunov filter as a modulated-demodulated controller in closed loop with a unity plant. Simulation and experimental results for a higher order Lyapunov filter as well as Butterworth and Chebyshev type demodulators are presented. | |
2017 |
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49. | M. G. Ruppert; D. M. Harcombe; M. R. P. Ragazzon; S. O. R. Moheimani; A. J. Fleming A Review of Demodulation Techniques for Amplitude Modulation Atomic Force Microscopy Journal Article In: Bellstein Journal of Nanotechnology, vol. 8, pp. 1407–1426, 2017. Abstract | Links | BibTeX | Tags: AFM, SPM @article{J17h, In this review paper, traditional and novel demodulation methods applicable to amplitude modulation atomic force microscopy are implemented on a widely used digital processing system. As a crucial bandwidth-limiting component in the z-axis feedback loop of an atomic force microscope, the purpose of the demodulator is to obtain estimates of amplitude and phase of the cantilever deflection signal in the presence of sensor noise or additional distinct frequency components. Specifically for modern multifrequency techniques, where higher harmonic and/or higher eigenmode contributions are present in the oscillation signal, the fidelity of the estimates obtained from some demodulation techniques is not guaranteed. To enable a rigorous comparison, the performance metrics tracking bandwidth, implementation complexity and sensitivity to other frequency components are experimentally evaluated for each method. Finally, the significance of an adequate demodulator bandwidth is highlighted during high-speed tapping-mode AFM experiments in constant height mode. | |
48. | M. R. P. Ragazzon; M. G. Ruppert; D. M. Harcombe; A. J. Fleming; J. T. Gravdahl Lyapunov Estimator for High-Speed Demodulation in Dynamic Mode Atomic Force Microscopy Journal Article In: IEEE Transactions on Control Systems Technology, vol. 26, no. 2, pp. 765-772, 2017. Abstract | Links | BibTeX | Tags: AFM, SPM @article{J17e, In dynamic mode atomic force microscopy (AFM), the imaging bandwidth is governed by the slowest component in the open-loop chain consisting of the vertical actuator, cantilever and demodulator. While the common demodulation method is to use a lock-in amplifier (LIA), its performance is ultimately bounded by the bandwidth of the post-mixing low-pass filters. This article proposes an amplitude and phase estimation method based on a strictly positive real Lyapunov design approach. The estimator is designed to be of low complexity while allowing for high bandwidth. Additionally, suitable gains for high performance are suggested such that no tuning is necessary. The Lyapunov estimator is experimentally implemented for amplitude demodulation and shown to surpass the LIA in terms of tracking bandwidth and noise performance. High-speed AFM images are presented to corroborate the results. | |
47. | D. M. Harcombe; M. G. Ruppert; A. J. Fleming Higher-harmonic AFM Imaging with a High-Bandwidth Multifrequency Lyapunov Filter Proceedings Article In: IEEE/ASME Advanced Intelligent Mechatronics (AIM), Munich, Germany, 2017. Abstract | BibTeX | Tags: Multifrequency AFM, SPM @inproceedings{C17e, A major difficulty in multifrequency atomic force microscopy (MF-AFM) is the accurate estimation of amplitude and phase at multiple frequencies for both z-axis feedback and material contrast imaging. Typically a lock-in amplifier is chosen as it is both narrowband and simple to implement. However, it inherently suffers drawbacks including a limited bandwidth due to post mixing low-pass filters and the necessity for multiple to be operated in parallel for MF-AFM. This paper proposes a multifrequency demodulator in the form of a modelbased Lyapunov filter implemented on a Field Programmable Gate Array (FPGA). System modelling and simulations are verified by experimental results demonstrating high tracking bandwidth and off-mode rejection at modelled frequencies. Additionally, AFM scans with a five-frequency-based system are presented wherein higher harmonic imaging is performed up to 1 MHz. | |
46. | M. G. Ruppert; D. M. Harcombe; M. R. P. Ragazzon; S. O. R. Moheimani; A. J. Fleming Frequency Domain Analysis of Robust Demodulators for High-Speed Atomic Force Microscopy Proceedings Article In: American Control Conference, Seattle, WA, 2017. @inproceedings{C17b, A fundamental but often overlooked component in the z-axis feedback loop of the atomic force microscope (AFM) operated in dynamic mode is the demodulator. It’s purpose is to obtain a preferably fast and low-noise estimate of amplitude and phase of the cantilever deflection signal in the presence of sensor noise and additional distinct frequency components. In this paper, we implement both traditional and recently developed robust methods on a labVIEW digital processing system and rigorously compare these techniques experimentally in terms of measurement bandwidth, implementation complexity and robustness to noise. We conclude with showing high-speed tapping-mode AFM images in constant height, highlighting the significance of an adequate demodulator bandwidth. | |
2016 |
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45. | Y. K. Yong; A. J. Fleming High-speed Vertical Positioning Stage with Integrated Dual-sensor Arrangement Journal Article In: Sensors & Actuators: A. Physical, vol. 248, pp. 184–192, 2016. Abstract | Links | BibTeX | Tags: Nanopositioning, Optics, SPM @article{J16d, This article presents a novel vertical positioning stage with a dual-sensor arrangement suitable for scanning probe microscopy. The stage has a travel range of 8.4um and a first resonance frequency of 24kHz in the direction of travel. The sensor arrangement consists of an integrated piezoelectric force sensor and laminated piezoresistive strain sensor. The piezoelectric force sensor exhibits extremely low noise and introduces a zero into the dynamics which allows the use of integral force feedback. This control method provides excellent damping performance and guaranteed stability. The piezoresistive sensor is used for tracking control with an analog PI controller which is shown to be an approximate inverse of the damped system. The resulting closed-loop system has a bandwidth is 11.4kHz and 6-sigma resolution of 3.6nm, which is ideal for nanopositioning and atomic force microscopy (AFM) applications. The proposed vertical stage is used to replace the vertical axis of a commercial AFM. Scans are performed in constant-force contact mode with a tip velocity of 0.2mm/s, 1mm/s and 2mm/s. The recorded images contain negligible artefacts due to insufficient vertical bandwidth. | |
44. | R. de Rozario; A. J. Fleming; T. Oomen Iterative Control for Periodic Tasks with Robustness Considerations, Applied to a Nanopositioning Stage Proceedings Article In: IFAC Symposium on Mechatronic Systems, Loughborough, UK, 2016. Abstract | BibTeX | Tags: Nanopositioning, SPM @inproceedings{C16g, Nanopositioning stages are an example of motion systems that are required to accurately perform a high frequent repetitive scanning motion. The tracking performance can be signicantly increased by iteratively updating a feedforward input by using a nonparametric inverse plant model. However, in this paper it is shown that current approaches lack systematic robustness considerations and are suering from limited design freedom to enforce satisfying convergence behavior. Therefore, inspired by existing the Iterative Learning Control approach, robustness is added to the existing methods to enable the desired convergence behavior. This results in the Robust Iterative Inversion-based Control method, whose potential for superior convergence is experimentally veried on a Nanopositioning system. | |
43. | A. J. Fleming; G. Berriman; Y. K. Yong Design, Modeling, and Characterization of an XY Nanopositioning Stage Constructed from a Single Sheet of Piezoelectric Material Proceedings Article In: IEEE Advanced Intelligent Mechatronics, Banff, Canada, 2016. Abstract | BibTeX | Tags: Nanopositioning, SPM @inproceedings{C16e, This article describes the design, fabrication and testing of a new XY nanopositioning stage constructed from a single sheet of piezoelectric material. The approach involves direct ultrasonic machining of a piezoelectric sheet to create flexural and actuator features. An industrial inkjet printer is then used to create electrode features by printing Nitric Acid directly onto the evaporated metal surface of the piezo sheet. The result is a monolithic piezoelectric structure with individual electrical control over each actuator feature. Experimental results demonstrate a full-scale range of 9um in the X and Y axes, and a first resonance frequency of 230Hz in the Z axes. The completed nanopositioner is the thinnest yet reported with a thickness of only 500um. The new design method will enable a new range of ultra-compact applications in scanning probe microscopy, scanning electron microscopy, and active optics. | |
42. | B. S. Routley; A. J. Fleming High Sensitivity Interferometer for on-Axis Detection of AFM Cantilever Deflection Proceedings Article In: International Conference on Manipulation, Automation and Robotics at Small Scales, Paris, France, 2016. Abstract | BibTeX | Tags: Optics, SPM @inproceedings{C16i, A homodyne path stabilised Michelson based interferometer displacement sensor was developed. This sensor achieved a noise floor of 100 fm/rt(Hz), for frequencies higher than 100 kHz. A prototype AFM that integrated this sensor was developed. Using tapping mode, topography maps of an AFM test grid were produced. | |
41. | Y. R. Teo; Y. K. Yong; A. J. Fleming A Review of Scanning Methods and Control Implications for Scanning Probe Microscopy (Invited Paper) Proceedings Article In: American Control Conference, Boston, MA, 2016., Boston, MA, 2016. BibTeX | Tags: Nanopositioning, SPM @inproceedings{C16c, | |
40. | M. R. P. Ragazzon; J. T. Gravdahl; A. J. Fleming On Amplitude Estimation for High-Speed Atomic Force Microscopy (invited) Proceedings Article In: American Control Conference, Boston, MA, 2016. @inproceedings{C16b, | |
2015 |
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39. | A. J. Fleming; Y. R. Teo; K. K. Leang Low-order Damping and Tracking Control for Scanning Probe Systems Journal Article In: Frontiers in Mechanical Engineering, vol. 1, pp. 1-9, 2015. Abstract | Links | BibTeX | Tags: Nanopositioning, SPM @article{J15e, This article describes an improvement to integral resonance damping control (IRC) for reference tracking applications such as Scanning Probe Microscopy and nanofabrication. It is demonstrated that IRC control introduces a low-frequency pole into the tracking loop which is detrimental for performance. In this work, the location of this pole is found analytically using Cardano’s method then compensated by parameterizing the tracking controller accordingly. This approach maximizes the closed-loop bandwidth whilst being robust to changes in the resonance frequencies. The refined IRC controller is comprehensively compared to other low-order methods in a practical environment. | |
38. | Y. R. Teo; A. A. Eielsen; A. J. Fleming Model-less FIR Repetitive Control with consideration of uncertainty Proceedings Article In: IEEE Multiconference on Systems and Control, Sydney, 2015. BibTeX | Tags: Nanopositioning, SPM @inproceedings{C15c, | |
37. | A. J. Fleming; B. S. Routley; J. L. Holdsworth A Closed-Loop Phase-Locked Interferometer for Wide Bandwidth Position Sensing Proceedings Article In: IEEE Multi-conference on Systems and Control, Sydney, 2015. BibTeX | Tags: Nanopositioning, Optics, SPM @inproceedings{C15a, | |
2014 |
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36. | A. J. Fleming; K. K. Leang Design, Modeling and Control of Nanopositioning Systems Book Springer, London, UK, 2014, ISBN: 978-3319066165. Abstract | Links | BibTeX | Tags: Nanopositioning, SPM @book{B14, Covering the complete design cycle of nanopositioning systems, this is the first comprehensive text on the topic. The book first introduces concepts associated with nanopositioning stages and outlines their application in such tasks as scanning probe microscopy, nanofabrication, data storage, cell surgery and precision optics. Piezoelectric transducers, employed ubiquitously in nanopositioning applications are then discussed in detail including practical considerations and constraints on transducer response. The reader is then given an overview of the types of nanopositioner before the text turns to the in-depth coverage of mechanical design including flexures, materials, manufacturing techniques, and electronics. This process is illustrated by the example of a high-speed serial-kinematic nanopositioner. Position sensors are then catalogued and described and the text then focuses on control. Several forms of control are treated: shunt control, feedback control, force feedback control and feedforward control (including an appreciation of iterative learning control). Performance issues are given importance as are problems limiting that performance such as hysteresis and noise which arise in the treatment of control and are then given chapter-length attention in their own right. The reader also learns about cost functions and other issues involved in command shaping, charge drives and electrical considerations. All concepts are demonstrated experimentally including by direct application to atomic force microscope imaging. Design, Modeling and Control of Nanopositioning Systems will be of interest to researchers in mechatronics generally and in control applied to atomic force microscopy and other nanopositioning applications. Microscope developers and mechanical designers of nanopositioning devices will find the text essential reading. | |
2013 |
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35. | A. J. Fleming; K. K. Leang An Experimental Comparison of PI, Inversion, and Damping Control for High Performance Nanopositioning Proceedings Article In: Proc. IEEE American Control Conference, Washington, DC, 2013. Links | BibTeX | Tags: Nanopositioning, SPM @inproceedings{C13b, | |
2011 |
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34. | B. J. Kenton; A. J. Fleming; K. K. Leang A compact ultra-fast vertical nanopositioner for improving SPM scan speed Journal Article In: Review of Scientific Instruments, vol. 82, no. 12, pp. 123703(1-8), 2011. Links | BibTeX | Tags: Nanopositioning, SPM @article{J11b, | |
33. | A. J. Fleming Dual-stage vertical feedback for high speed-scanning probe microscopy Journal Article In: IEEE Transactions on Control Systems Technology, vol. 19, no. 1, pp. 156–165, 2011. Links | BibTeX | Tags: Nanopositioning, SPM @article{J11a, | |
32. | M. Fairbairn; S. O. R. Moheimani; A. J. Fleming Q control of an atomic force microscope micro-cantilever: a sensor-less approach Journal Article In: IEEE/ASME Journal of Microelectromechanical Systems, vol. 20, no. 6, pp. 1372–1381, 2011. Links | BibTeX | Tags: Nanopositioning, SPM @article{J11c, | |
31. | A. J. Fleming A method for reducing piezoelectric non-linearity in scanning probe microscope images Proceedings Article In: Proc. American Control Conference, pp. 2861–2866, San Francisco, CA, 2011. Links | BibTeX | Tags: Nanopositioning, SPM @inproceedings{C11a, | |
30. | M. Fairbairn; S. O. R. Moheimani; A. J. Fleming Improving the scan rate and image quality in tapping mode atomic force microscopy with piezoelectric shunt control Proceedings Article In: Proc. Australian Control Conference, Melbourne, Australia, 2011. Links | BibTeX | Tags: Nanopositioning, SPM @inproceedings{C11d, | |
29. | M. Fairbairn; S. O. R. Moheimani; A. J. Fleming Passive piezoelectric shunt control of an atomic force microscope microcantilever Proceedings Article In: Proc. IEEE/ASME International Conference on Advanced Intelligent Mechatronics, Budapest, Hungary, 2011. BibTeX | Tags: Nanopositioning, SPM @inproceedings{C11b, | |
28. | Y. K. Yong; A. J. Fleming; S. O. R. Moheimani Vibration and tracking control of a flexure-guided nanopositioner using a piezoelectric strain sensor (Invited Paper) Proceedings Article In: Proc. International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, Changchun, China, 2011. Links | BibTeX | Tags: Nanopositioning, SPM @inproceedings{C11c, | |
2010 |
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27. | A. J. Fleming; S. S. Aphale; S. O. R. Moheimani A new method for robust damping and tracking control of scanning probe microscope positioning stages Journal Article In: IEEE Transactions on Nanotechnology, vol. 9, no. 4, pp. 438–448, 2010. Links | BibTeX | Tags: Nanopositioning, SPM @article{J10d, | |
26. | A. J. Fleming Quantitative SPM topographies by charge linearization of the vertical actuator Journal Article In: Review of Scientific Instruments, vol. 81, no. 10, pp. 103701(1-5), 2010. Links | BibTeX | Tags: Nanopositioning, SPM @article{J10f, | |
25. | A. J. Fleming; K. K. Leang Integrated strain and force feedback for high performance control of piezoelectric actuators Journal Article In: Sensors and Actuators A, vol. 161, no. 1-2, pp. 256–265, 2010. Links | BibTeX | Tags: Nanopositioning, SPM @article{J10b, | |
24. | A. J. Fleming; B. J. Kenton; K. K. Leang Bridging the gap between conventional and video-speed scanning probe microscopes Journal Article In: Ultramicroscopy, vol. 110, no. 9, pp. 1205–1214, 2010. Links | BibTeX | Tags: Nanopositioning, SPM @article{J10c, | |
23. | S. Kuiper; A. J. Fleming; G. Schitter Dual actuation for high-speed atomic force microscopy Proceedings Article In: Proc. IFAC Symposium on Mechatronic Systems, pp. 220–226, Boston, MA, 2010. Links | BibTeX | Tags: Nanopositioning, SPM @inproceedings{C10d, | |
22. | A. J. Fleming Ultra-fast dual-stage vertical positioning for high performance SPMs Proceedings Article In: Proc. American Control Conference, pp. 4975–4980, Baltimore, MD, 2010. Links | BibTeX | Tags: Nanopositioning, SPM @inproceedings{C10b, | |
2009 |
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21. | K. K. Leang; A. J. Fleming High-speed serial-kinematic AFM scanner: design and drive considerations Journal Article In: Asian Journal of Control, vol. 11, no. 2, pp. 144-153, 2009. Links | BibTeX | Tags: Nanopositioning, SPM @article{J09a, | |
20. | A. J. Fleming; A. G. Wills Optimal periodic trajectories for band-limited systems Journal Article In: IEEE Transactions on Control Systems Technology, vol. 13, no. 3, pp. 552-562, 2009. Links | BibTeX | Tags: Nanopositioning, SPM @article{J09b, | |
19. | A. J. Fleming High-speed vertical positioning for contact-mode atomic force microscopy Proceedings Article In: Proc. IEEE/ASME International Conference on Advanced Intelligent Mechatronics, pp. 522-527, Singapore, 2009. Links | BibTeX | Tags: Piezoelectric Transducers and Drives, SPM @inproceedings{C09c, | |
18. | A. J. Fleming; S. S. Aphale; S. O. R. Moheimani A new robust damping and tracking controller for SPM positioning stages Proceedings Article In: Proc. American Control Conference, St. Louis, MO, 2009. Links | BibTeX | Tags: Nanopositioning, SPM @inproceedings{C09a, | |
2008 |
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17. | A. J. Fleming; K. K. Leang Charge drives for scanning probe microscope positioning stages Journal Article In: Ultramicroscopy, vol. 108, no. 12, pp. 1551-1557, 2008. Links | BibTeX | Tags: Nanopositioning, SPM @article{J08e, | |
16. | A. J. Fleming; A. G. Wills; S. O. R. Moheimani Sensor fusion for improved control of piezoelectric tube scanners Journal Article In: IEEE Transactions on Control Systems Technology, vol. 15, no. 6, pp. 1265–6536, 2008. Links | BibTeX | Tags: Nanopositioning, SPM @article{J08d, | |
15. | J. Maess; A. J. Fleming; F. Allgöwer Simulation of dynamics-coupling in piezoelectric tube scanners by reduced order finite element models Journal Article In: Review of Scientific Instruments, vol. 79, pp. 015105(1-9), 2008. Links | BibTeX | Tags: Nanopositioning, SPM @article{J08a, | |
14. | A. J. Fleming; K. K. Leang Evaluation of charge drives for scanning probe microscope positioning stages Proceedings Article In: Proc. American Control Conference, pp. 2028–2033, Seattle, WA, 2008. Links | BibTeX | Tags: Nanopositioning, SPM @inproceedings{C08a, | |
13. | K. K. Leang; A. J. Fleming High-speed serial-kinematic AFM scanner: Design and drive considerations Proceedings Article In: Proc. American Control Conference, pp. 3188–3193, Seattle, WA, 2008. Links | BibTeX | Tags: Nanopositioning, SPM @inproceedings{C08b, | |
12. | J. Maess; A. J. Fleming; F. Allgöwer Model-based vibration suppression in piezoelectric tube scanners through induced voltage feedback Proceedings Article In: Proc. American Control Conference, pp. 2022–2027, Seattle, WA, 2008. Links | BibTeX | Tags: Nanopositioning, SPM @inproceedings{C08c, | |
11. | A. J. Fleming; A. G. Wills Optimal input signals for bandlimited scanning systems Proceedings Article In: Proc. IFAC World Congress, pp. 11805-11810, Seoul, Korea, 2008. Links | BibTeX | Tags: Nanopositioning, SPM @inproceedings{C08d, | |
2007 |
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10. | S. S. Aphale; A. J. Fleming; S. O. R. Moheimani High speed nano-scale positioning using a piezoelectric tube actuator with active shunt control Journal Article In: IET Micro & Nano Letters, vol. 2, no. 1, pp. 9–12, 2007. Links | BibTeX | Tags: Nanopositioning, SPM @article{J07c, | |
9. | B. Bhikkaji; M. Ratnam; A. J. Fleming; S. O. R. Moheimani High-performance control of piezoelectric tube scanners Journal Article In: IEEE Transactions on Control Systems Technology, vol. 15, no. 5, pp. 853-866, 2007. Links | BibTeX | Tags: Nanopositioning, SPM @article{J07d, | |
8. | J. Maess; A. J. Fleming; F. Allgöwer Simulation of piezoelectric tube actuators by reduced finite element models for controller design Proceedings Article In: Proc. American Control Conference, New York, NY, 2007. Links | BibTeX | Tags: Nanopositioning, SPM @inproceedings{C07b, | |
7. | A. J. Fleming; A. G. Wills; S. O. R. Moheimani Sensor fusion for improved control of piezoelectric tube scanners Proceedings Article In: Proc. IEEE/ASME International Conference on Advanced Intelligent Mechatronics, Zurich, Switzerland, 2007. Links | BibTeX | Tags: Nanopositioning, SPM @inproceedings{C07a, | |
6. | S. S. Aphale; S. O. R. Moheimani; A. J. Fleming Dominant resonant mode damping of a piezoelectric tube nanopositioner using optimal sensorless shunts Proceedings Article In: Proc. American Control Conference, New York, NY, 2007. Links | BibTeX | Tags: Nanopositioning, SPM @inproceedings{C07c, | |
2006 |
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5. | A. J. Fleming; S. O. R. Moheimani Sensorless vibration suppression and scan compensation for piezoelectric tube nanopositioners Journal Article In: IEEE Transactions on Control Systems Technology, vol. 14, no. 1, pp. 33–44, 2006. Links | BibTeX | Tags: Nanopositioning, SPM @article{J06b, | |
4. | B. Bhikkaji; M. Ratnam; A. J. Fleming; S. O. R. Moheimani High-performance control of a PZT Scanner Proceedings Article In: Proc. IFAC Symposium on Mechatronic Systems, Heidelberg, Germany, 2006. Links | BibTeX | Tags: Nanopositioning, SPM @inproceedings{C06c, | |
2005 |
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3. | A. J. Fleming; S. O. R. Moheimani A grounded load charge amplifier for reducing hysteresis in piezoelectric tube scanners Journal Article In: Review of Scientific Instruments, vol. 76, no. 7, pp. 073707(1-5), 2005. Links | BibTeX | Tags: Piezoelectric Transducers and Drives, SPM @article{J05d, | |
2. | M. Ratnam; B. Bhikkaji; A. J. Fleming; S. O. R. Moheimani PPF control of a piezoelectric tube scanner Proceedings Article In: Proc. IEEE Conference on Decision and Control and European Control Conference, Seville, Spain, 2005. Links | BibTeX | Tags: Nanopositioning, SPM @inproceedings{C05c, | |
1. | A. J. Fleming; S. O. R. Moheimani Sensor-less vibration suppression and scan compensation for piezoelectric tube nanopositioners Proceedings Article In: Proc. IEEE Conference on Decision and Control and European Control Conference, Seville, Spain, 2005. Links | BibTeX | Tags: Nanopositioning, SPM @inproceedings{C05b, |
2020 |
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59. | Integrated force and displacement sensing in active microcantilevers for off-resonance tapping mode atomic force microscopy Proceedings Article In: International Conference on Manipulation, Automation and Robotics at Small Scales (MARSS), pp. 1-6, 2020. | |
58. | A comparison of gold and silver nanocones and geometry optimisation for tip-enhanced microscopy Journal Article In: Journal of Raman Spectroscopy, vol. 51, iss. 11, pp. 2208-2216, 2020. | |
57. | Overcoming the Limitations of Tip Enhanced Raman Spectroscopy with Intermittent Contact AFM Conference 8th Multifrequency AFM Conference, Madrid, Spain, 2020. | |
56. | A review of demodulation techniques for multifrequency atomic force microscopy Journal Article In: Beilstein Journal of Nanotechnology, vol. 11, pp. 76-97, 2020, ISSN: 21904286. | |
2019 |
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55. | Design and Analysis of Low-Distortion Demodulators for Modulated Sensors Journal Article In: IEEE/ASME Transactions on Mechatronics, vol. 24, no. 4, pp. 1861-1870, 2019, ISSN: 10834435. | |
54. | Model-based Q Factor Control for Photothermally Excited Microcantilevers Proceedings Article In: Int. Conference on Manipulation, Automation and Robotics at Small Scales (MARSS), Helsinki, Finland, 2019, ISSN: 978-1-7281-0948-0. | |
53. | Multimodal atomic force microscopy with optimized higher eigenmode sensitivity using on-chip piezoelectric actuation and sensing Journal Article In: Nanotechnology, vol. 30, no. 8, pp. 085503, 2019. | |
2018 |
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52. | A monolithic serial-kinematic nanopositioner with integrated sensors and actuators Proceedings Article In: IEEE International Conference on Advanced Intelligent Mechatronics, Auckland, New Zealand, 2018. | |
51. | A Comparison Of Scanning Methods And The Vertical Control Implications For Scanning Probe Microscopy Journal Article In: Asian Journal of Control, vol. 30, no. 4, pp. 1-15, 2018. | |
50. | Direct Design of Closed-loop Demodulators for Amplitude Modulation Atomic Force Microscopy Proceedings Article In: American Control Conference, Milwaukee, WI, 2018. | |
2017 |
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49. | A Review of Demodulation Techniques for Amplitude Modulation Atomic Force Microscopy Journal Article In: Bellstein Journal of Nanotechnology, vol. 8, pp. 1407–1426, 2017. | |
48. | Lyapunov Estimator for High-Speed Demodulation in Dynamic Mode Atomic Force Microscopy Journal Article In: IEEE Transactions on Control Systems Technology, vol. 26, no. 2, pp. 765-772, 2017. | |
47. | Higher-harmonic AFM Imaging with a High-Bandwidth Multifrequency Lyapunov Filter Proceedings Article In: IEEE/ASME Advanced Intelligent Mechatronics (AIM), Munich, Germany, 2017. | |
46. | Frequency Domain Analysis of Robust Demodulators for High-Speed Atomic Force Microscopy Proceedings Article In: American Control Conference, Seattle, WA, 2017. | |
2016 |
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45. | High-speed Vertical Positioning Stage with Integrated Dual-sensor Arrangement Journal Article In: Sensors & Actuators: A. Physical, vol. 248, pp. 184–192, 2016. | |
44. | Iterative Control for Periodic Tasks with Robustness Considerations, Applied to a Nanopositioning Stage Proceedings Article In: IFAC Symposium on Mechatronic Systems, Loughborough, UK, 2016. | |
43. | Design, Modeling, and Characterization of an XY Nanopositioning Stage Constructed from a Single Sheet of Piezoelectric Material Proceedings Article In: IEEE Advanced Intelligent Mechatronics, Banff, Canada, 2016. | |
42. | High Sensitivity Interferometer for on-Axis Detection of AFM Cantilever Deflection Proceedings Article In: International Conference on Manipulation, Automation and Robotics at Small Scales, Paris, France, 2016. | |
41. | A Review of Scanning Methods and Control Implications for Scanning Probe Microscopy (Invited Paper) Proceedings Article In: American Control Conference, Boston, MA, 2016., Boston, MA, 2016. | |
40. | On Amplitude Estimation for High-Speed Atomic Force Microscopy (invited) Proceedings Article In: American Control Conference, Boston, MA, 2016. | |
2015 |
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39. | Low-order Damping and Tracking Control for Scanning Probe Systems Journal Article In: Frontiers in Mechanical Engineering, vol. 1, pp. 1-9, 2015. | |
38. | Model-less FIR Repetitive Control with consideration of uncertainty Proceedings Article In: IEEE Multiconference on Systems and Control, Sydney, 2015. | |
37. | A Closed-Loop Phase-Locked Interferometer for Wide Bandwidth Position Sensing Proceedings Article In: IEEE Multi-conference on Systems and Control, Sydney, 2015. | |
2014 |
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36. | Design, Modeling and Control of Nanopositioning Systems Book Springer, London, UK, 2014, ISBN: 978-3319066165. | |
2013 |
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35. | An Experimental Comparison of PI, Inversion, and Damping Control for High Performance Nanopositioning Proceedings Article In: Proc. IEEE American Control Conference, Washington, DC, 2013. | |
2011 |
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34. | A compact ultra-fast vertical nanopositioner for improving SPM scan speed Journal Article In: Review of Scientific Instruments, vol. 82, no. 12, pp. 123703(1-8), 2011. | |
33. | Dual-stage vertical feedback for high speed-scanning probe microscopy Journal Article In: IEEE Transactions on Control Systems Technology, vol. 19, no. 1, pp. 156–165, 2011. | |
32. | Q control of an atomic force microscope micro-cantilever: a sensor-less approach Journal Article In: IEEE/ASME Journal of Microelectromechanical Systems, vol. 20, no. 6, pp. 1372–1381, 2011. | |
31. | A method for reducing piezoelectric non-linearity in scanning probe microscope images Proceedings Article In: Proc. American Control Conference, pp. 2861–2866, San Francisco, CA, 2011. | |
30. | Improving the scan rate and image quality in tapping mode atomic force microscopy with piezoelectric shunt control Proceedings Article In: Proc. Australian Control Conference, Melbourne, Australia, 2011. | |
29. | Passive piezoelectric shunt control of an atomic force microscope microcantilever Proceedings Article In: Proc. IEEE/ASME International Conference on Advanced Intelligent Mechatronics, Budapest, Hungary, 2011. | |
28. | Vibration and tracking control of a flexure-guided nanopositioner using a piezoelectric strain sensor (Invited Paper) Proceedings Article In: Proc. International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, Changchun, China, 2011. | |
2010 |
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27. | A new method for robust damping and tracking control of scanning probe microscope positioning stages Journal Article In: IEEE Transactions on Nanotechnology, vol. 9, no. 4, pp. 438–448, 2010. | |
26. | Quantitative SPM topographies by charge linearization of the vertical actuator Journal Article In: Review of Scientific Instruments, vol. 81, no. 10, pp. 103701(1-5), 2010. | |
25. | Integrated strain and force feedback for high performance control of piezoelectric actuators Journal Article In: Sensors and Actuators A, vol. 161, no. 1-2, pp. 256–265, 2010. | |
24. | Bridging the gap between conventional and video-speed scanning probe microscopes Journal Article In: Ultramicroscopy, vol. 110, no. 9, pp. 1205–1214, 2010. | |
23. | Dual actuation for high-speed atomic force microscopy Proceedings Article In: Proc. IFAC Symposium on Mechatronic Systems, pp. 220–226, Boston, MA, 2010. | |
22. | Ultra-fast dual-stage vertical positioning for high performance SPMs Proceedings Article In: Proc. American Control Conference, pp. 4975–4980, Baltimore, MD, 2010. | |
2009 |
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21. | High-speed serial-kinematic AFM scanner: design and drive considerations Journal Article In: Asian Journal of Control, vol. 11, no. 2, pp. 144-153, 2009. | |
20. | Optimal periodic trajectories for band-limited systems Journal Article In: IEEE Transactions on Control Systems Technology, vol. 13, no. 3, pp. 552-562, 2009. | |
19. | High-speed vertical positioning for contact-mode atomic force microscopy Proceedings Article In: Proc. IEEE/ASME International Conference on Advanced Intelligent Mechatronics, pp. 522-527, Singapore, 2009. | |
18. | A new robust damping and tracking controller for SPM positioning stages Proceedings Article In: Proc. American Control Conference, St. Louis, MO, 2009. | |
2008 |
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17. | Charge drives for scanning probe microscope positioning stages Journal Article In: Ultramicroscopy, vol. 108, no. 12, pp. 1551-1557, 2008. | |
16. | Sensor fusion for improved control of piezoelectric tube scanners Journal Article In: IEEE Transactions on Control Systems Technology, vol. 15, no. 6, pp. 1265–6536, 2008. | |
15. | Simulation of dynamics-coupling in piezoelectric tube scanners by reduced order finite element models Journal Article In: Review of Scientific Instruments, vol. 79, pp. 015105(1-9), 2008. | |
14. | Evaluation of charge drives for scanning probe microscope positioning stages Proceedings Article In: Proc. American Control Conference, pp. 2028–2033, Seattle, WA, 2008. | |
13. | High-speed serial-kinematic AFM scanner: Design and drive considerations Proceedings Article In: Proc. American Control Conference, pp. 3188–3193, Seattle, WA, 2008. | |
12. | Model-based vibration suppression in piezoelectric tube scanners through induced voltage feedback Proceedings Article In: Proc. American Control Conference, pp. 2022–2027, Seattle, WA, 2008. | |
11. | Optimal input signals for bandlimited scanning systems Proceedings Article In: Proc. IFAC World Congress, pp. 11805-11810, Seoul, Korea, 2008. | |
2007 |
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10. | High speed nano-scale positioning using a piezoelectric tube actuator with active shunt control Journal Article In: IET Micro & Nano Letters, vol. 2, no. 1, pp. 9–12, 2007. | |
9. | High-performance control of piezoelectric tube scanners Journal Article In: IEEE Transactions on Control Systems Technology, vol. 15, no. 5, pp. 853-866, 2007. | |
8. | Simulation of piezoelectric tube actuators by reduced finite element models for controller design Proceedings Article In: Proc. American Control Conference, New York, NY, 2007. | |
7. | Sensor fusion for improved control of piezoelectric tube scanners Proceedings Article In: Proc. IEEE/ASME International Conference on Advanced Intelligent Mechatronics, Zurich, Switzerland, 2007. | |
6. | Dominant resonant mode damping of a piezoelectric tube nanopositioner using optimal sensorless shunts Proceedings Article In: Proc. American Control Conference, New York, NY, 2007. | |
2006 |
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5. | Sensorless vibration suppression and scan compensation for piezoelectric tube nanopositioners Journal Article In: IEEE Transactions on Control Systems Technology, vol. 14, no. 1, pp. 33–44, 2006. | |
4. | High-performance control of a PZT Scanner Proceedings Article In: Proc. IFAC Symposium on Mechatronic Systems, Heidelberg, Germany, 2006. | |
2005 |
||
3. | A grounded load charge amplifier for reducing hysteresis in piezoelectric tube scanners Journal Article In: Review of Scientific Instruments, vol. 76, no. 7, pp. 073707(1-5), 2005. | |
2. | PPF control of a piezoelectric tube scanner Proceedings Article In: Proc. IEEE Conference on Decision and Control and European Control Conference, Seville, Spain, 2005. | |
1. | Sensor-less vibration suppression and scan compensation for piezoelectric tube nanopositioners Proceedings Article In: Proc. IEEE Conference on Decision and Control and European Control Conference, Seville, Spain, 2005. |