325 entries « 39 of 65 »

Bazaei, A.; Yong, Y. K.; Moheimani, S. O. R.; Sebastian, A.

Tracking of triangular references using signal transformation for control of a novel AFM scanner stage Journal Article

In: IEEE Transactions on Control Systems Technology, vol. 20, no. 2, pp. 453-464, 2012.

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Tracking of triangular references using signal transformation for control of a novel AFM scanner stage

Wadikhaye, S. P.; Yong, Y. K.; Moheimani, S. O. R.

Design of a compact serial-kinematic scanner for high-speed atomic force microscopy: An analytical approach Journal Article

In: Micro and Nano Letters, vol. 7, no. 4, pp. 309-313, 2012.

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Design of a compact serial-kinematic scanner for high-speed atomic force microscopy: An analytical approach

Yong, Y. K.; Bazaei, A.; Moheimani, S. O. R.; Allgower, F.

Design and control of a novel non-raster scan pattern for fast scanning probe microscopy (Invited Paper) Proceedings Article

In: IEEE/ASME International Conference on Advanced Intelligent Mechatronics, Kaohsiung, Taiwan, pp. 456-461, 2012.

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Design and control of a novel non-raster scan pattern for fast scanning probe microscopy (Invited Paper)

Yong, Y. K.; Moheimani, S. O. R.; Kenton, B. J.; Leang, K. K.

Invited review article: High-speed flexure-guided nanopositioning: Mechanical design and control issues Journal Article

In: Review of Scientific Instruments, vol. 83, no. 121101, pp. (1-22), 2012.

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Invited review article: High-speed flexure-guided nanopositioning: Mechanical design and control issues

Fleming, A. J.

Dual-stage vertical feedback for high speed-scanning probe microscopy Journal Article

In: IEEE Transactions on Control Systems Technology, vol. 19, no. 1, pp. 156–165, 2011.

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Dual-stage vertical feedback for high speed-scanning probe microscopy
325 entries « 39 of 65 »