afm

Linlin Li: Tracking control of the scanner for high-speed scanning of the AFM

Date & Venue Tuesday, 04 February 2020, 04:00pm EF122  Abstract The Atomic Force Microscope (AFM) has emerged as an indispensable research tool in the development of nanoscience and nanotechnology. Piezoelectrically actuated nanopositioning stages are widely employed in AFMs to realize accurate the positioning of the sample-to-be-scanned, due to several performance advantages such as fine resolution, [...]