Daniel Martin Jimenez: Atomic Force Microscopy: From Liquid to Ultra-high Vacuum Environments

Date & Venue Monday, 10 February 2020, 10:00am EF122  AbstractThe atomic force microscope (AFM) is a versatile tool that can operate in contact or dynamic mode on metallic, semiconductor, insulator or biological samples in liquid, air and vacuum environments. The sensor and the operational mode of an AFM must be selected a priori before each [...]