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2019

6.Scan Rate Adaptation for AFM Imaging Based on Performance Metric Optimisation

K. Wang; M. G. Ruppert; C. Manzie; D. Nesic; Y. K. Yong

Scan Rate Adaptation for AFM Imaging Based on Performance Metric Optimisation Journal Article

IEEE/ASME Transactions on Mechatronics, 2019, (early access).

Abstract | Links | BibTeX | Tags: AFM, Nanopositioning, Scan Pattern, SPM, Tracking Control

2018

5.A Comparison Of Scanning Methods And The Vertical Control Implications For Scanning Probe Microscopy

Y. R. Teo; Y. K. Yong; A. J. Fleming

A Comparison Of Scanning Methods And The Vertical Control Implications For Scanning Probe Microscopy Journal Article

Asian Journal of Control, 30 (4), pp. 1-15, 2018.

Abstract | Links | BibTeX | Tags: Scan Pattern, SPM

2017

4.Combining Spiral Scanning and Internal Model Control for Sequential AFM Imaging at Video Rate

A. Bazaei; Y. K. Yong; S. O. R. Moheimani

Combining Spiral Scanning and Internal Model Control for Sequential AFM Imaging at Video Rate Journal Article

IEEE Transactions on Mechatronics, 22 (1), pp. 371-380, 2017.

Abstract | Links | BibTeX | Tags: Scan Pattern, SPM

2015

3.Internal Model Control for High-speed Spiral Scan AFM

A. Bazaei; Y. K. Yong; S. O. R. Moheimani

Internal Model Control for High-speed Spiral Scan AFM Inproceedings

Australian Control Conference, Gold Coast, Australia, 2015.

BibTeX | Tags: Nanopositioning, Scan Pattern

2012

2.Design and control of a novel non-raster scan pattern for fast scanning probe microscopy (Invited Paper)

Y. K. Yong; A. Bazaei; S. O. R. Moheimani; F. Allgower

Design and control of a novel non-raster scan pattern for fast scanning probe microscopy (Invited Paper) Inproceedings

IEEE/ASME International Conference on Advanced Intelligent Mechatronics, Kaohsiung, Taiwan, pp. 456-461, 2012.

Links | BibTeX | Tags: Nanopositioning, Scan Pattern, SPM

2011

1.

Y. K. Yong; S. O. R. Moheimani; I. R. Petersen

A Non-raster Scan Method for High-speed SPM Inproceedings

IEEE/ASME International Conference on Advanced Intelligent Mechatronics, Budapest, Hungary, 2011.

BibTeX | Tags: Nanopositioning, Scan Pattern, SPM