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2018

1.A Comparison Of Scanning Methods And The Vertical Control Implications For Scanning Probe Microscopy

Y. R. Teo; Y. K. Yong; A. J. Fleming

A Comparison Of Scanning Methods And The Vertical Control Implications For Scanning Probe Microscopy Journal Article

In: Asian Journal of Control, vol. 30, no. 4, pp. 1-15, 2018.

Abstract | Links | BibTeX | Tags: Scan Pattern, SPM