325 entries « 45 of 65 »

Yong, Y. K.; Ahmed, B.; Moheimani, S. O. R.

Atomic force microscopy with a 12-electrode piezoelectric tube scanner Journal Article

In: Review of Scientific Instruments, vol. 81, no. 033701, pp. (1-10), 2010.

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Atomic force microscopy with a 12-electrode piezoelectric tube scanner

Yong, Y. K.; Liu, K.; Moheimani, S. O. R.

Reducing cross-coupling in a compliant XY nanopositioner for fast and accurate raster scanning Journal Article

In: IEEE Transactions on Control Systems Technology, vol. 18, no. 5, pp. 1172-1179, 2010.

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Reducing cross-coupling in a compliant XY nanopositioner for fast and accurate raster scanning

Yong, Y. K.; Moheimani, S. O. R.; Petersen, I. R.

High-speed cycloid-scan atomic force microscopy Journal Article

In: Nanotechnology, vol. 21, no. 36, 2010.

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High-speed cycloid-scan atomic force microscopy

Leang, K. K.; Fleming, A. J.

High-speed serial-kinematic AFM scanner: design and drive considerations Journal Article

In: Asian Journal of Control, vol. 11, no. 2, pp. 144-153, 2009.

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Fleming, A. J.; Wills, A. G.

Optimal periodic trajectories for band-limited systems Journal Article

In: IEEE Transactions on Control Systems Technology, vol. 13, no. 3, pp. 552-562, 2009.

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325 entries « 45 of 65 »