Scanning Probe Microscopy
Probe Based Lithography
Probe based lithography involves creating nanometer sized features from photoresist and metal on conducting and semiconducting substrates. Near field optical, electrical and thermal fields are employed in combination with evaporation, etching and electroplating to provide high-speed alternatives for mask-less nanofabrication.
Nanopositioning
A nanopositioner is a electromechanical device for moving objects in three dimensions with atomic, or sub-atomic resolution. Nanopositioners are employed in applications such as imaging, fabrication and optics. This field encompasses mechanical design, sensor design, and control theory. More details.
Electroactive Optics
Piezoelectric actuators can be combined with mirrors, lenses and objectives to actively control the path and properties of an optical field or laser beam. High speed electro-optics are required for precision lasers, maskless lithography, and microscopy.
Precision Sensors
This project aims to study the fundamental limitations of capacitive, optical and magnetic position sensors. New techniques are under development to provide sub-atomic resolution over extremely wide bandwidth.
Biomedical Devices
An endoscopic pill robot is being developed for noninvasive imaging and intervention. The robot can be swallowed and includes power transmission, 6-Dimensional localization, and locomotion.
Piezo Actuators and Amplifiers
Piezo Robotics
Due to their compact size and high efficiency, piezoelectric actuators are ideal for micro-actuation in bio-inspired robotics. This project is developing actuators and mechanics for a piezoelectric dragon-fly robot.
Routley, B. S.; Holdsworth, J. L.; Fleming, A. J.
Optimization of near-field scanning optical lithography Proceedings Article
In: Proc. SPIE Advanced Lithography, San Jose, CA, 2015.
@inproceedings{D15a,
title = {Optimization of near-field scanning optical lithography},
author = {B. S. Routley and J. L. Holdsworth and A. J. Fleming},
url = {https://www.precisionmechatronicslab.com/wp-content/uploads/2015/05/D15a.pdf},
year = {2015},
date = {2015-02-26},
booktitle = {Proc. SPIE Advanced Lithography},
address = {San Jose, CA},
keywords = {},
pubstate = {published},
tppubtype = {inproceedings}
}
Fleming, A. J.; Leang, K. K.
Design, Modeling and Control of Nanopositioning Systems Book
Springer, London, UK, 2014, ISBN: 978-3319066165.
@book{B14,
title = {Design, Modeling and Control of Nanopositioning Systems},
author = {A. J. Fleming and K. K. Leang},
url = {http://www.amazon.com/Modeling-Control-Nanopositioning-Advances-Industrial/dp/3319066161 },
isbn = {978-3319066165},
year = {2014},
date = {2014-12-30},
publisher = {Springer},
address = {London, UK},
abstract = {Covering the complete design cycle of nanopositioning systems, this is the first comprehensive text on the topic. The book first introduces concepts associated with nanopositioning stages and outlines their application in such tasks as scanning probe microscopy, nanofabrication, data storage, cell surgery and precision optics. Piezoelectric transducers, employed ubiquitously in nanopositioning applications are then discussed in detail including practical considerations and constraints on transducer response. The reader is then given an overview of the types of nanopositioner before the text turns to the in-depth coverage of mechanical design including flexures, materials, manufacturing techniques, and electronics. This process is illustrated by the example of a high-speed serial-kinematic nanopositioner. Position sensors are then catalogued and described and the text then focuses on control.
Several forms of control are treated: shunt control, feedback control, force feedback control and feedforward control (including an appreciation of iterative learning control). Performance issues are given importance as are problems limiting that performance such as hysteresis and noise which arise in the treatment of control and are then given chapter-length attention in their own right. The reader also learns about cost functions and other issues involved in command shaping, charge drives and electrical considerations. All concepts are demonstrated experimentally including by direct application to atomic force microscope imaging.
Design, Modeling and Control of Nanopositioning Systems will be of interest to researchers in mechatronics generally and in control applied to atomic force microscopy and other nanopositioning applications. Microscope developers and mechanical designers of nanopositioning devices will find the text essential reading.},
keywords = {},
pubstate = {published},
tppubtype = {book}
}
Several forms of control are treated: shunt control, feedback control, force feedback control and feedforward control (including an appreciation of iterative learning control). Performance issues are given importance as are problems limiting that performance such as hysteresis and noise which arise in the treatment of control and are then given chapter-length attention in their own right. The reader also learns about cost functions and other issues involved in command shaping, charge drives and electrical considerations. All concepts are demonstrated experimentally including by direct application to atomic force microscope imaging.
Design, Modeling and Control of Nanopositioning Systems will be of interest to researchers in mechatronics generally and in control applied to atomic force microscopy and other nanopositioning applications. Microscope developers and mechanical designers of nanopositioning devices will find the text essential reading.
Fleming, A. J.
Measuring and predicting resolution in nanopositioning systems Journal Article
In: Mechatronics, vol. 24, no. 8, pp. 605-618, 2014.
@article{J14a,
title = {Measuring and predicting resolution in nanopositioning systems},
author = {A. J. Fleming},
url = {https://www.precisionmechatronicslab.com/wp-content/uploads/2014/09/J14a.pdf},
year = {2014},
date = {2014-12-01},
journal = {Mechatronics},
volume = {24},
number = {8},
pages = {605-618},
abstract = {The resolution is a critical performance metric of precision mechatronic systems such as nanopositioners and atomic force microscopes. However, there is not presently a strict definition for the measurement or reporting of this parameter. This article defines resolution as the smallest distance between two nonoverlapping position commands. Methods are presented for simulating and predicting resolution in both the time and frequency domains. In order to simplify resolution measurement, a new technique is proposed which allows the resolution to be estimated from a measurement of the closed-loop actuator voltage. Simulation and experimental results demonstrate the proposed techniques. The paper concludes by
comparing the resolution benefits of new control schemes over standard output feedback techniques.},
keywords = {},
pubstate = {published},
tppubtype = {article}
}
comparing the resolution benefits of new control schemes over standard output feedback techniques.
Namavar, M.; Fleming, A. J.; Aleyaasin, M.; Nakkeeran, K.; Aphale, S. S.
An Analytical approach to integral resonant control of second-order systems Journal Article
In: IEEE/ASME Transactions on Mechatronics, vol. 19, no. 2, pp. 651–659, 2014.
@article{J14c,
title = {An Analytical approach to integral resonant control of second-order systems},
author = {M. Namavar and A. J. Fleming and M. Aleyaasin and K. Nakkeeran and S. S. Aphale},
url = {https://www.precisionmechatronicslab.com/wp-content/uploads/2014/05/J14c.pdf},
year = {2014},
date = {2014-12-01},
journal = {IEEE/ASME Transactions on Mechatronics},
volume = {19},
number = {2},
pages = {651--659},
keywords = {},
pubstate = {published},
tppubtype = {article}
}
Teo, Y. R.; Russell, D.; Aphale, S. S.; Fleming, A. J.
Optimal Integral Force Feedback and Structured PI Tracking Control: Application for High Speed Confocal Microscopy Journal Article
In: Mechatronics, vol. 24, no. 6, pp. 701-711, 2014.
@article{J14d,
title = {Optimal Integral Force Feedback and Structured PI Tracking Control: Application for High Speed Confocal Microscopy},
author = {Y. R. Teo and D. Russell and S. S. Aphale and A. J. Fleming},
url = {https://www.precisionmechatronicslab.com/wp-content/uploads/2014/09/J14d.pdf},
year = {2014},
date = {2014-12-01},
journal = {Mechatronics},
volume = {24},
number = {6},
pages = {701-711},
abstract = {This paper describes a new vibration damping technique based on Integral Force Feedback (IFF). Classical IFF utilizes a force sensor and integral controller to damp the resonance modes of a mechanical system. However, the maximum modal damping depends on the frequency difference between the system’s poles and zeros. If the frequency difference is small, the achievable modal damping may be severely limited. The proposed technique allows an arbitrary damping ratio to be achieved by introducing an additional feed-through term to the control system. This results in an extra degree of freedom that allows the position of the zeros to be modified and the maximum modal damping to be increased. The second contribution of this paper is a structured PI tracking controller that is parameterized to cancel the additional pole introduced by integral force feedback. The parameterized controller has only one tuning parameter and does not suffer from reduced phase margin. The proposed techniques are demonstrated on a piezoelectric objective lens positioner. The results show exceptional tracking and damping performance while maintaining insensitivity to changes in resonance frequency. The maximum bandwidth achievable with a commercial PID controller is 26.1 Hz. In contrast, with the proposed damping and tracking controller, the bandwidth is increased to 255 Hz.},
keywords = {},
pubstate = {published},
tppubtype = {article}
}