Date & Venue:
Monday, 25 November 2019, 03:00pm
EF122
Abstract:
The microcantilever is a precision microelectromechanical systems (MEMs) device and an integral component of a myriad of systems which have collectively enabled the steady progress in nanotechnology over the past three decades. It is a key component and sits at the heart of a variety of instruments for manipulation and interrogation at the nanoscale, such as atomic force microscopes, scanning probe lithography systems, high-resolution mass sensors, and probe-based data storage systems. Despite its apparent simplicity, the fast dynamics, particularly when interacting with nonlinear forces arising at the micro- and nanoscale, have motivated significant research on the design, instrumentation, system identification and control of these devices. In this talk, I will discuss our advances in integrating actuation and sensing onto the MEMs chip level and the implications of such approaches for control. As a result of using these active cantilevers, the ability to control the quality factor in order to manipulate the cantilever tracking bandwidth and tip-sample dissipation is demonstrated.
Speaker Biography:
Michael G. Ruppert received the Dipl.-Ing. degree in automation technology in production from the University of Stuttgart, Germany, in 2013 and the Ph.D. degree in electrical engineering from The University of Newcastle, Australia in 2017. As a visiting researcher, he was with The University of Texas at Dallas, USA from 2015 until 2016 and he is currently a postdoctoral research fellow at The University of Newcastle. Dr Ruppert’s research has been recognized with the Best Conference Paper Award at the 2019 International Conference on Manipulation, Automation and Robotics at Small Scales (MARSS), the 2018 IEEE Transactions on Control Systems Technology Outstanding Paper Award, and the 2017 University of Newcastle Higher Degree by Research Excellence Award. He is a member of the IEEE Control Systems Society Conference Editorial Board and serves as an associate editor for ACC, CDC and IEEE Control Systems Letters. Dr Ruppert’s research interests include the utilization of system theoretic tools for sensing, estimation and control in high-speed and multifrequency atomic force microscopy.