Publications

@article{J23a,

title = {Feasibility of gold nanocones for collocated tip-enhanced Raman spectroscopy and atomic force microscope imaging },

author = {L. R. McCourt and B. S. Routley and M. G. Ruppert and A. J. Fleming},

url = {https://www.precisionmechatronicslab.com/wp-content/uploads/2024/02/J23a-Preprint.pdf},

doi = {10.1002/jrs.6625},

issn = {1097-4555},

year  = {2024},

date = {2024-02-01},

urldate = {2024-02-01},

journal = {Journal of Raman Spectroscopy},

abstract = {Microcantilever probes for tip-enhanced Raman spectroscopy (TERS) have a grainy metal coating that may exhibit multiple plasmon hotspots near the tip apex, which may compromise spatial resolution and introduce imaging artefacts. It is also possible that the optical hotspot may not occur at the mechanical apex, which introduces an offset between TERS and atomic force microscope maps. In this article, a gold nanocone TERS probe is designed and fabricated for 638 nm excitation. The imaging performance is compared to grainy probes by analysing high-resolution TERS cross-sections of single-walled carbon nanotubes. Compared to the tested conventional TERS probes, the nanocone probe exhibited a narrow spot diameter, comparable optical contrast, artefact-free images, and collocation of TERS and atomic force microscope topographic maps. The spot diameter was 12.5 nm and 19 nm with 638 nm and 785 nm excitation, respectively. These results were acquired using a single gold nanocone probe to experimentally confirm feasibility. Future work will include automating the fabrication process and statistical analysis of many probes.},

keywords = {AFM, Cantilever, Optics},

pubstate = {forthcoming},

tppubtype = {article}

}

@article{Ruppert2022,

title = {Experimental Analysis of Tip Vibrations at Higher Eigenmodes of QPlus Sensors for Atomic Force Microscopy},

author = {M. G. Ruppert and D. Martin-Jimenez and Y. K. Yong and A. Ihle and A. Schirmeisen and A. J. Fleming and D. Ebeling},

url = {https://www.precisionmechatronicslab.com/wp-content/uploads/2022/03/J22c.pdf},

doi = {10.1088/1361-6528/ac4759},

issn = {1361-6528},

year  = {2022},

date = {2022-02-10},

urldate = {2022-02-10},

journal = {Nanotechnology},

volume = {33},

issue = {18},

pages = {185503},

abstract = {QPlus sensors are non-contact atomic force microscope probes constructed from a quartz tuning fork and a tungsten wire with an electrochemically etched tip. These probes are self-sensing and offer an atomic-scale spatial resolution. Therefore, qPlus sensors are routinely used to visualize the chemical structure of adsorbed organic molecules via the so-called bond imaging technique. This is achieved by functionalizing the AFM tip with a single CO molecule and exciting the sensor at the first vertical cantilever resonance mode. Recent work using higher-order resonance modes has also resolved the chemical structure of single organic molecules. However, in these experiments, the image contrast can differ significantly from the conventional bond imaging contrast, which was suspected to be caused by unknown vibrations of the tip. This work investigates the source of these artefacts by using a combination of mechanical simulation and laser vibrometry to characterize a range of sensors with different tip wire geometries. The results show that increased tip mass and length cause increased torsional rotation of the tuning fork beam due to the off-center mounting of the tip wire, and increased flexural vibration of the tip. These undesirable motions cause lateral deflection of the probe tip as it approaches the sample, which is rationalized to be the cause of the different image contrast. The results also provide a guide for future probe development to reduce these issues.},

keywords = {Actuator, AFM, Cantilever, Multifrequency AFM, piezoelectric},

pubstate = {published},

tppubtype = {article}

}

@article{Ruppert2021,

title = {Active atomic force microscope cantilevers with integrated device layer piezoresistive sensors},

author = {M. G. Ruppert and A. J. Fleming and Y. K. Yong},

url = {https://www.precisionmechatronicslab.com/wp-content/uploads/2021/01/J21a.pdf},

doi = {10.1016/j.sna.2020.112519},

issn = {0924-4247},

year  = {2021},

date = {2021-01-19},

urldate = {2021-01-19},

journal = {Sensors & Actuators: A. Physical},

volume = {319},

pages = {112519},

abstract = {Active atomic force microscope cantilevers with on-chip actuation and sensing provide several advantages over

passive cantilevers which rely on piezoacoustic base-excitation and optical beam deflection measurement. Active

microcantilevers exhibit a clean frequency response, provide a path-way to miniturization and parallelization and

avoid the need for optical alignment. However, active microcantilevers are presently limited by the feedthrough

between actuators and sensors, and by the cost associated with custom microfabrication. In this work, we propose

a hybrid cantilever design with integrated piezoelectric actuators and a piezoresistive sensor fabricated from the

silicon device layer without requiring an additional doping step. As a result, the design can be fabricated using a

commercial five-mask microelectromechanical systems fabrication process. The theoretical piezoresistor sensitivity

is compared with finite element simulations and experimental results obtained from a prototype device. The

proposed approach is demonstrated to be a promising alternative to conventional microcantilever actuation and

deflection sensing},

keywords = {AFM, Cantilever, MEMS, Sensors, Smart Structures},

pubstate = {published},

tppubtype = {article}

}

@article{McCourt2020,

title = {A comparison of gold and silver nanocones and geometry optimisation for tip-enhanced microscopy},

author = {L. McCourt and M. G. Ruppert and B. S. Routley and S. Indirathankam and A. J. Fleming},

url = {https://www.precisionmechatronicslab.com/wp-content/uploads/2020/09/J20e.pdf},

doi = {https://doi.org/10.1002/jrs.5987},

year  = {2020},

date = {2020-11-01},

urldate = {2020-08-24},

journal = {Journal of Raman Spectroscopy},

volume = {51},

issue = {11},

pages = {2208-2216},

abstract = {In this article, boundary element method simulations are used to optimise the geometry of silver and gold nanocone probes to maximise the localised electric field enhancement and tune the near-field resonance wavelength. These objectives are expected to maximise the sensitivity of tip-enhanced Raman microscopes. Similar studies have used limited parameter sets or used a performance metric other than localised electric field enhancement. In this article, the optical responses for a range of nanocone geometries are simulated for excitation wavelengths ranging from 400 to 1000 nm. Performance is evaluated by measuring the electric field enhancement at the sample surface with a resonant illumination wavelength. These results are then used to determine empirical models and derive optimal nanocone geometries for a particular illumination wavelength and tip material. This article concludes that gold nanocones are expected to provide similar performance to silver nanocones at red and nearinfrared wavelengths, which is consistent with other results in the literature. In this article, 633 nm is determined to be the shortest usable illumination wavelength for gold nanocones. Below this limit, silver nanocones will provide superior enhancement. The use of gold nanocone probes is expected to dramatically improve probe lifetime, which is currently measured in hours for silver coated probes. Furthermore, the elimination of passivation coatings is expected to enable smaller probe radii and improved topographical resolution.},

keywords = {AFM, Cantilever, MEMS, Optics, SPM},

pubstate = {published},

tppubtype = {article}

}

@article{Ruppert2020,

title = {Amplitude Noise Spectrum of a Lock-in Amplifier: Application to Microcantilever Noise Measurements},

author = {M. G. Ruppert and N. J. Bartlett and Y. K. Yong and A. J. Fleming},

url = {https://www.precisionmechatronicslab.com/wp-content/uploads/2020/09/J20f.pdf},

doi = {10.1016/j.sna.2020.112092},

year  = {2020},

date = {2020-05-29},

journal = {Sensors and Actuators A: Physical},

volume = {312},

pages = {112092},

abstract = {The lock-in amplifier is a crucial component in many applications requiring high-resolution displacement sensing; it's purpose is to estimate the amplitude and phase of a periodic signal, potentially corrupted by noise, at a frequency determined by a reference signal. Where the noise can be approximated by a stationary Gaussian process, such as thermal force noise and electronic sensor noise, this article derives the amplitude noise spectral density of the lock-in-amplifier output. The proposed method is demonstrated by predicting the demodulated noise spectrum of a microcantilever for dynamic-mode atomic force microscopy to determine the cantilever on-resonance thermal noise, the cantilever tracking bandwidth and the electronic noise floor. The estimates are shown to closely match experimental results over a wide range of operating conditions.},

keywords = {AFM, Cantilever, Demodulation, MEMS, System Identification},

pubstate = {published},

tppubtype = {article}

}

@article{Ruppert2018b,

title = {Multimodal atomic force microscopy with optimized higher eigenmode sensitivity using on-chip piezoelectric actuation and sensing},

author = {M. G. Ruppert and S. I. Moore and M. Zawierta and A. J. Fleming and G. Putrino and Y. K. Yong},

url = {https://www.precisionmechatronicslab.com/wp-content/uploads/2019/08/Ruppert_2019_Nanotechnology_30_085503.pdf},

doi = {https://doi.org/10.1088/1361-6528/aae40b},

year  = {2019},

date = {2019-01-02},

journal = {Nanotechnology},

volume = {30},

number = {8},

pages = {085503},

abstract = {Atomic force microscope (AFM) cantilevers with integrated actuation and sensing provide several distinct advantages over conventional cantilever instrumentation. These include clean frequency responses, the possibility of down-scaling and parallelization to cantilever arrays as well as the absence of optical interference. While cantilever microfabrication technology has continuously advanced over the years, the overall design has remained largely unchanged; a passive rectangular shaped cantilever design has been adopted as the industry wide standard. In this article, we demonstrate multimode AFM imaging on higher eigenmodes as well as bimodal AFM imaging with cantilevers using fully integrated piezoelectric actuation and sensing. The cantilever design maximizes the higher eigenmode deflection sensitivity by optimizing the transducer layout according to the strain mode shape. Without the need for feedthrough cancellation, the read-out method achieves close to zero actuator/sensor feedthrough and the sensitivity is sufficient to resolve the cantilever Brownian motion.},

keywords = {AFM, Cantilever, MEMS, Multifrequency AFM, Piezoelectric Transducers and Drives, Sensors, Smart Structures, SPM},

pubstate = {published},

tppubtype = {article}

}